Measuring method for stray capacitance of large-capacity high-frequency transformer
A high-frequency transformer and parasitic capacitance technology, applied in the field of circuit system analysis, can solve the problems of measurement equipment requirements, lack of simple measurement methods for large-capacity high-frequency transformer parasitic capacitance, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0038] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.
[0039] An embodiment of a method for measuring the parasitic capacitance of a large-capacity high-frequency transformer provided by the present invention is as follows: figure 1 As shown, specifically:
[0040] 1. If Image 6 As shown in the figure, the excitation signal with variable frequency is applied to the high-frequency transformer through the signal generator, and the oscilloscope collects the voltage signal u of the primary side winding of the high-frequency transformer 1 and the current signal i 1 , the oscilloscope ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com