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High Power High Voltage Inspection Equipment

A kind of inspection equipment, high-power technology, applied in the direction of voltage/current isolation, instrument, test dielectric strength, etc., can solve the problems of limited application possibilities, cooling problems, etc., and achieve the effect of simple transportation

Active Publication Date: 2020-02-07
B2 ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Obviously, the cost of a (mobile) high-power high-voltage testing device of this type is largely determined by the output power to be applied by the relevant device, so that in practice high-voltage testing devices of the type mentioned at the outset are usually ordered according to different power Classes are provided, the application possibilities of which are limited (depending on the voltage amplitudes that can be generated with the relevant test equipment and the output power provided here)
[0007] And finally, especially when high output powers are to be provided in high-voltage test equipment, the required cooling of the high-voltage electronics in the different voltage amplifier branches, in particular the components arranged on the high-voltage side, is increasingly prove to be problematic

Method used

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  • High Power High Voltage Inspection Equipment
  • High Power High Voltage Inspection Equipment
  • High Power High Voltage Inspection Equipment

Examples

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Embodiment Construction

[0044] figure 1 A high-voltage testing device 1 according to the invention is shown schematically with a central control unit 3 arranged in a separate component 2 .

[0045] The means for generating a test voltage (an alternating voltage with an absolute magnitude of at least 100 kV at a power greater than 1 kW) is formed by (at least) two voltage amplifier branches 4, 5, wherein figure 1 The voltage amplifier branch 4 shown on the left serves to generate the positive voltage half-wave of the test voltage and figure 1 The voltage amplifier branch 5 shown on the right serves to generate the negative voltage half-wave of the test voltage.

[0046] The test voltage itself is then applied to the connection 6 for the measuring object to be tested (eg a high-voltage cable not shown), wherein the connection 6 is formed on the assembly 2 containing the central control unit 3 . The (positive and negative) voltage half-waves provided by the two voltage amplifier branches 4, 5 are alte...

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PUM

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Abstract

The invention relates to a high-power high-voltage testing device (1) comprising means for generating a testing voltage, wherein the testing voltage is an alternating voltage having an amplitude of at least 100 kV at a power greater than 1 kW. The device for generating a test voltage has at least two voltage amplifier branches (4, 5), wherein the first voltage amplifier branch (4) contributes to the generation of the positive voltage half-wave of the test voltage and the second voltage amplifier branch Circuit (5) helps to generate the negative voltage half-wave of the test voltage. The high voltage test device (1) also has a measuring circuit (17, 23, 24) for measuring the test voltage applied to the measurement object and the test current induced in the measurement object thereby, and is characterized in that each voltage amplifier The branches (4, 5) are arranged in separate components (26, 27) with integrated active air cooling.

Description

technical field [0001] The invention relates to a high-power high-voltage test device comprising means for generating a test voltage at a power greater than 1 kW, wherein the test voltage is an alternating voltage having an amplitude of at least 100 kV and wherein the means for generating the test voltage has At least two voltage amplifier branches, wherein the first voltage amplifier branch is used for or contributes to the generation of the positive voltage half-wave of the test voltage and the second voltage amplifier branch is used for or contributes to the generation of the negative voltage of the test voltage half wave. Furthermore, high-power high-voltage test devices of this type have a measuring circuit for measuring the test voltage to be applied to the measurement object and the test current induced thereby in the measurement object. Background technique [0002] Such high-voltage testing devices are sufficiently known from the prior art and are used for testing ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/12G01R31/14G01R31/16G01R31/00G01R31/58
CPCG01R31/1272G01R31/14G01R31/58G01R1/44G01R15/14
Inventor R.布兰克S.巴尔多夫
Owner B2 ELECTRONICS