Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Temperature measurement at high-voltage potential

A high-voltage electricity, temperature measurement technology, used in thermometers, thermometers with directly sensitive electrical/magnetic components, and heat measurement, to achieve the effect of less energy demand

Active Publication Date: 2016-01-13
SIEMENS ENERGY GLOBAL GMBH CO & KG
View PDF9 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, sufficient power must be provided continuously

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Temperature measurement at high-voltage potential

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] figure 1 Shown is a device 1 for temperature measurement at a high voltage potential, comprising an optical current transformer 2, an electronic temperature sensor 4, a first and a second optical waveguide 6, 8 and a first light emitting diode 10, which is located at ground Within station 24. In addition, the temperature sensor 4 includes exactly one photodiode 12 , a capacitor 14 , a control unit 16 and an oscillation circuit 18 . Furthermore, the second LED 20 and the temperature-sensing resistor 22 are located in the current loop of the oscillator circuit 18 . Here, the temperature sensing resistor 22 can be, for example, a thermistor, a PT100, a thermal element or a semiconductor sensor.

[0024] Light from the first light emitting diode 10 is conducted via the first optical waveguide 6 to the photodiode 12 in the electronic temperature sensor 4 . The optical waveguides 6, 8 may preferably be standard multimode optical waveguides or 200 / 220 μm Hard-Cladding-Silic...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Optical poweraaaaaaaaaa
Login to View More

Abstract

Described is an arrangement for temperature measurement at high-voltage potential. The energy for measuring the temperature of an optical current transformer is provided by precisely one photodiode. The photodiode is supplied by means of light from a light source, the light from the light source being guided to the photodiode via an optical waveguide.

Description

technical field [0001] The invention relates to a device for temperature measurement at a high voltage potential using an electronic temperature sensor that measures the temperature of an optical current transformer and is powered by a light source. Background technique [0002] Optical current transformers have been known for a long time. A current transformer is generally understood to be a measuring transducer which has a sensor probe for the potential-free measurement of an alternating current. Optical current transformers are used to measure the Faraday effect. The Faraday effect describes the polarization rotation of a linearly polarized electromagnetic wave as it passes through a transparent medium on which a temporally constant magnetic field parallel to the direction of propagation of the wave is applied. [0003] Optical current transformers are also increasingly being used for high voltage potentials. Such an optical current transformer is disclosed, for exampl...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01K7/20G01K7/24
CPCG01K7/203G01K7/245G01K2215/00G01K7/20G01K7/22G01K13/00
Inventor M.里克特M.威尔施
Owner SIEMENS ENERGY GLOBAL GMBH CO & KG
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products