Phase modulation imaging mode scanning device and method of SICM

An imaging mode, phase modulation technology, applied in measurement devices, scanning probe technology, scanning probe microscopy, etc., can solve the problems of slow scanning speed, poor system stability, etc. The effect of speeding up scanning

Active Publication Date: 2016-02-03
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] In order to improve the above deficiencies such as slow scanning speed and poor system stability when working for a long time, t

Method used

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  • Phase modulation imaging mode scanning device and method of SICM
  • Phase modulation imaging mode scanning device and method of SICM
  • Phase modulation imaging mode scanning device and method of SICM

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Embodiment 1

[0049] 1. Use a standard grid of silicon material (P / N498-000-026, Digital Instruments) with a width of 5μm and a depth of 200nm for AFM calibration as the master, face up, and pour 10:1 PDMS (Sylgard184, DowCorning) The mixture of the main agent and hardener evenly stirred; vacuum for another 20 minutes to make the mixture free of bubbles; then place it on the heating plate (PC-600, Corning) and bake at 70°C for 4-5 hours; finally, after curing The PDMS layer is torn off from the silicon standard grid. At this time, the PDMS surface close to the silicon grid will be imprinted with a fine structure complementary to the grid, thus obtaining a PDMS material grid sample.

[0050] 2. Put the side of the PDMS sample with the imprinted structure facing up, and dip the bottom surface into a Φ35mm petri dish. Use a micropipette to pour phosphate buffer saline (PBS) into the petri dish. The best solution is 2mm above the surface of the PDMS sample;

[0051] 3. The glass tube probe is drawn ...

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Abstract

The invention relates to a phase modulation imaging mode scanning device of an SICM. The scanning device comprises a signal generator, a phase-locked amplifier, a patch clamp amplifier, a controller, a probe, an XY nanometer platform and a Z-direction nanometer piezoelectric ceramic. The signal generator, the patch clamp amplifier, the phase-locked amplifier and the controller are connected in sequence; the signal generator is connected with the phase-locked amplifier; and the patch clamp amplifier is connected with the probe. The method comprises the following steps: the signal generator outputs two paths of AC signals to the phase-locked amplifier and the patch clamp amplifier respectively; the compensation capacitance of the patch clamp amplifier is adjusted; the phase-locked amplifier extracts current component and feeds back the amplitude to the controller; and the controller controls the height of the probe in real time according to the amplitude, and scanning of a sample is realized. According to the phase modulation imaging mode scanning device and method, only the alternating current component under some frequency is extracted to serve as the feedback value, so that the defects of DC drifting and easy electrical noise influence under a DC mode and the like can be overcome; and compared with a conventional AC mode, the method realizes higher modulation frequency, and the purpose of accelerating scanning can be realized.

Description

Technical field [0001] The invention relates to a novel micro-nano-level fast, high-stability and non-destructive imaging technology, in particular to a novel imaging mode-phase modulation mode scanning device and method based on scanning ion conductance microscope (SICM) technology. Background technique [0002] At present, scanning ion conductance microscope (SICM) has been widely used in biology, chemistry, materials and other fields. Especially in live cell imaging, it has become a powerful tool for researchers due to its unique non-destructive and non-force contact imaging characteristics. SICM is a member of the scanning probe microscope family, but different from other scanning probe microscopes, it relies on the current flowing through the ultramicro glass tube probe to vary with the distance between the probe samples. The probe and the sample are scanned. It can maintain a distance of tens of nanometers. At this time, the probe is weak to the sample, and the sample will ...

Claims

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Application Information

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IPC IPC(8): G01Q60/44
Inventor 刘连庆李鹏李广勇王越超杨洋张常麟
Owner SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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