Multi-pin-based defect detection device and detection method thereof

A defect detection and detection method technology, which is applied in the direction of measuring devices, optical testing of flaws/defects, and material analysis through optical means, can solve problems such as low automation and low detection efficiency, improve production efficiency, and reduce production costs. , the effect of meeting the needs of automated production

Active Publication Date: 2016-03-23
南京河豚智能科技有限公司
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Problems solved by technology

[0005] Purpose of the invention: In order to overcome the low detection efficiency and low degree of automation existing in the existing multi-pin defect detection method, the first purpose of the present invention is to provide a high-efficiency, high-accuracy multi-pin-based defect detection device

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  • Multi-pin-based defect detection device and detection method thereof
  • Multi-pin-based defect detection device and detection method thereof
  • Multi-pin-based defect detection device and detection method thereof

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Embodiment Construction

[0036] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings.

[0037] Such as figure 1 , figure 2 As shown, the present invention discloses a multi-pin-based defect detection device, which includes a camera 1 for collecting sample images, and two LED light sources 2 using high-angle lighting are symmetrically arranged under the camera 1. Below the LED light source 2, there is a transmission platform 3 for placing and transporting samples, and the side of the transmission platform 3 is provided with a rejection mechanism 4 for rejecting unqualified samples; the camera 1 is used to receive and process the collected samples. The industrial computer 5 for the image is connected, and the industrial computer 5 is also connected with a display 6 for displaying the image processing result made by the industrial computer 5 .

[0038] The conveying platform 3 is a belt conveying platform.

[0039] The rejecting...

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Abstract

The invention discloses a multi-pin-based defect detection device and a detection method thereof. The defect detection device comprises a camera for collecting a sample image, wherein two LED light sources adopting a high-angle lighting method are symmetrically arranged below the camera, a transmitting platform for placing and transporting a sample is arranged below the LED light sources, and the side edge of the transmitting platform is provided with a removing mechanism for removing an unqualified sample; the camera is connected with an industrial personal computer which is for receiving and processing the collected sample image, and the industrial personal computer is also connected with a displayer for displaying an image processing result made by the industrial personal computer. The multi-pin-based defect detection device and the detection method thereof realize automatic online detection on a multi-pin defect, the production cost is lowered, the detection efficiency is improved, the away-detection precision is greatly increased, and a detection missing phenomenon and a detection error phenomenon in conventional manual direction are well avoided.

Description

technical field [0001] The invention relates to the field of product quality detection, in particular to a multi-pin-based defect detection device and a detection method thereof. Background technique [0002] In manufacturing, a section of the end of the lead is soldered to form a solder joint with the pad on the printed board. Pins, also known as pins, are called Pins in English. It is the connection between the internal circuit of the integrated circuit (chip) and the peripheral circuit, and all the pins constitute the interface of the chip. The quality of the pins directly affects the performance of the chip and is related to the quality of the chip. [0003] At present, after the production process of pin products is completed, the number of pins of the chip is mainly detected by manual visual inspection methods, and the pin spacing of the chip is measured with a caliper. This traditional visual inspection method consumes huge human resources and brings huge economic ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG01N21/8851G01N2021/8864G01N2021/8887
Inventor 陆起涌陈卫
Owner 南京河豚智能科技有限公司
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