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Stand-alone test backboard design method for testing blade server

A blade server and test backplane technology, which is applied in the computer field, can solve problems such as difficult operation, damage to the motherboard, and cumbersome test steps, and achieve the effects of improving use efficiency, strong practicability, and saving test space and test equipment costs

Active Publication Date: 2016-04-27
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The test steps are cumbersome;
[0007] The motherboard installation and removal process is easy to cause damage to the motherboard;
[0008] It is difficult to scan the code (SN, MAC...) to upload the test record during the functional test of the main board, because the scanning gun cannot reach into the chassis

Method used

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  • Stand-alone test backboard design method for testing blade server

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Embodiment Construction

[0027] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0028] The present invention provides a single-machine test backplane design method for testing blade servers. The present invention is based on the current situation that the current blade server test environment is difficult to build, the space requirements and test equipment are high, and the production test is difficult to use. We designed This kind of blade test backplane, so as to achieve the purpose of reducing the test space and equipment cost, and improving work efficiency, as attached figure 1 As shown, the specific implementation process is:

[0029] The test backplane adopts the same blade interface as the blade server chassis backplane, supports half-height (Half) and full-height (Full) blades, ensures that the blade can be inserted into the test backplane, and leads out all signals from the blade to the peripheral equipment of the...

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Abstract

The preset invention discloses a stand-alone test backboard design method for testing a blade server. The method comprises the steps of installing a blade interface and a power interface which are identical with a blade server enclosure backboard to be test on a test backboard; installing connecting interfaces comprising a plurality of PCIE slots and a BMC interface; installing a plurality of EEPROMs; setting a network circuit, and ensuring that all onboard network signals of a blade are connected through the network circuit on the test backboard; setting a network interface, and selecting to switch the onboard network signals of the blade into the network interface and the network circuit through a switch so as to satisfy two test environments including laboratory test and production test; and setting an I2C bus. The stand-alone test backboard design method for testing the blade server, compared with the prior art, can largely save test space and equipment cost and improve test efficiency, and is high in practicality and easy to promote.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a single-machine test backplane design method for testing blade servers with high practicability. Background technique [0002] The current blade server chassis (Enclosure) generally supports multiple blades (Blade). We need server chassis to build a test platform for blade development verification in the laboratory or functional testing in blade motherboard production. If you use a huge server If you use a chassis to build a test platform, you need to assemble fans, power supplies, backplanes, control modules and other chassis peripherals with the chassis. This action will have the following two problems: [0003] Occupies a large test space; [0004] Test equipment is expensive. [0005] In the production of the PCBA of the blade motherboard for functional testing, it is necessary to install the PCBA of the motherboard to be tested into the blade case, then insert it into t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/273
CPCG06F11/273
Inventor 孙连震王佩
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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