Technical method of infrared detector indium bump
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- WUHAN GAOXIN TECH
- Publication Date
- 2016-05-11
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of detectors, and in particular, provides a process method for an indium column of an infrared detector. Background technique
[0002] The photosensitive part of the infrared detector is connected with the readout circuit part through an indium column. Under the requirement of increasing pixel density, the distance between pixels is getting smaller and smaller, and the diameter of the indium column is also reduced, but its height cannot be reduced. When the diameter is reduced but the height remains the same, the indium column is easy to grow into a conical shape. This is because during the indium deposition process, the indium on the photoresist mask will not only grow thicker, but also grow laterally, resulting in the deposition of indium. The window of the pillar shrinks, so that the deposited indium pillar becomes smaller in diameter and finally becomes tapered. Generally, when the growth height of ind...