Central sensor restoration method and central sensor

A repair method and sensor technology, applied in the direction of semiconductor/solid-state device testing/measurement, etc., can solve the problems of performance and function maintenance, debugging, component substitution difficulties, increasing maintenance difficulty, laser diode exit angle, and inability to find laser diodes, etc. The effect of reducing laser power requirements, shortening laser paths, and reducing laser energy consumption

Active Publication Date: 2016-06-01
WUXI CHINA RESOURCE MICRO ASSEMBLY TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] 1. Laser diode monopoly, the original light source (ie laser diode) is model IM220, with PD (feedback protection terminal), common anode laser diode, this type of laser diode cannot be found in the market;
[0006] 2. The light receiving surface is too small and the position is limited. The effective area of ​​the light emitted by the laser diode to the receiving surface through the lens is 1mm (determined by measuring the spot), and the center sensor is mainly positioned by detecting the edge of the small hole of the lead frame. Therefore, manufacturing a 1mm restricted area on the light receiving

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  • Central sensor restoration method and central sensor
  • Central sensor restoration method and central sensor
  • Central sensor restoration method and central sensor

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Example Embodiment

[0032] Such as figure 1 As shown, the first specific implementation of the present invention first provides a method for repairing a central sensor, which includes the following steps:

[0033] Step one S1: Remove the entire light receiving surface including the small hole and the mirror surface and the built-in optical path in the original center sensor.

[0034] In this step, due to the original central sensor assembly structure and the firmness of the material, the head must be completely destroyed to facilitate the operation of the subsequent steps.

[0035] Step two S2: Take out the receiving tube and place it in the original small hole.

[0036] See figure 2 As shown, the receiving tube 10 (ie, silicon photocell) is taken out from the original central sensor position and placed in the original small hole 100 position. At this time, the direction of the receiving surface of the receiving tube 10 is set downward to facilitate receiving the laser light emitted by the laser diode ...

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Abstract

The invention discloses a central sensor restoration method and a central sensor. The method comprises the steps: removing a whole light receiving surface, which comprises a small hole and a mirror plane, and a built-in optical path in an original central sensor; taking out a receiving pipe, placing the receiving pipe at the position of the small hoe, and enabling the receiving surface of the receiving pipe to face downwards; selecting the position of a light receiving surface through measuring an output voltage of the central sensor; and enabling the receiving pipe to be fixed. The method shortens a laser path and reduces the laser energy consumption because of the removal of the internal optical path, thereby reducing the requirements for laser power and prolonging the service life of a laser diode. Meanwhile, because the position of the light receiving surface can be adjusted, the method can select the optimal absorption position of a silicon photocell, and greatly reduce the restoration difficulty.

Description

technical field [0001] The invention relates to the technical field of semiconductor equipment, in particular to a method for repairing a center sensor and a center sensor that is easy to repair. Background technique [0002] The center sensor is an important part of the ESEC (European Semiconductor Equipment Center, European Semiconductor Equipment Center) chip loading machine, which is mainly used for anti-reverse and preliminary positioning of the lead frame. Center sensors are expensive and have an extremely low repair rate. The damage of the center sensor is mostly due to the aging of the optical path. [0003] Such as Figure 5 As shown, the original photoelectric detection area of ​​the central sensor is a small hole 100 with a diameter of 1 mm, surrounded by a layer of mirror 200 . Its detection principle is as Figure 6 As shown, the laser diode 300 emits laser light, which enters the small hole 100 after being focused by the lens, and then enters the silicon pho...

Claims

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Application Information

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IPC IPC(8): H01L21/66
Inventor 蔡剑史建伟吴亚利龚晟
Owner WUXI CHINA RESOURCE MICRO ASSEMBLY TECH
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