Orthogonal reference phase verification method and device

A verification method and phase technology, applied in the field of verification method of quadrature reference phase and its device, can solve the problems that the phase shift of RC phase shifter cannot be accurately measured, affected, and cannot be accurately measured

Active Publication Date: 2016-06-22
BEIJING DONGFANG MEASUREMENT & TEST INST
View PDF6 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] Since the parameters such as capacitance loss, resistance time constant, parasitic inductance, and parasitic conductance are the parasitic parameters of standard capacitors and resistors, they play a decisive role in the phase shift of the...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Orthogonal reference phase verification method and device
  • Orthogonal reference phase verification method and device
  • Orthogonal reference phase verification method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0062] In order to enable those skilled in the art to better understand the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and implementation methods.

[0063] refer to figure 2 The quadrature reference phase verification device of the present invention is shown, which includes a standard phase source, two PXI (extensions for the interconnection of peripheral components of the instrument system) dual-channel sampling cards, a PXI controller and high-precision clocks such as rubidium clocks, etc. . Among them, the standard phase source can provide two quadrature output voltages with a nominal 90° and 270° phase difference. The output high end and low end of each voltage are respectively connected to the two input high ends of the PXI dual-channel sampling card. The sampling measurement system is composed of Floating differential sampling, each sampled value is input to the PXI controller and DFT...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an orthogonal reference phase verification method and device, and the specific verification method comprises the steps: 1, enabling a standard phase source to output orthogonal vector voltages U1 and U2 (nominal: 90 degrees or 270 degrees); 2, employing a phase sampling measurement system to measure the above orthogonal vector voltages U1 and U2: enabling a voltage channel 1 of the phase sampling measurement system to measure the vector voltage U1 and enabling a voltage channel 2 of the phase sampling measurement system to measure the voltage U2, wherein the phase difference between the vector voltages U1 and U2 measured by the phase sampling measurement system is shown in the description; 3, interchanging the voltage channels of the phase sampling measurement system, changing the measurement direction of the vector voltage U1, wherein the phase difference between U2 and U1 measured by the phase sampling measurement system is shown in the description; 4, calculating a quadrature phase error, setting a quadrature phase measurement error of the phase sampling measurement system as delta, setting the nominal orthogonal output phase error (shown in the description) of the standard phase source, and building two linear equations in two unknowns according to the above two phase errors (shown in the description), thereby calculating the quadrature phase error value delta and the nominal orthogonal output phase error (shown in the description).

Description

technical field [0001] The present invention relates to a measurement method and device, in particular to a verification method and device for a quadrature reference phase. Background technique [0002] In the fields of AC measurement such as AC impedance and AC power, the most critical thing is to obtain two orthogonal reference standards. In the early stage, transformers with high Q value (or known Q), capacitors with low loss factor (or known low loss factor), AC resistors with low time constant (or known time constant), etc., or between them Some combination that produces a known analog reference phase angle standard. With the development of digital measurement technology, in many digital measurement instruments, digital phase shifting technology is used to generate quadrature reference signals. In the process of DFT-based AC power measurement, in order to obtain Fourier coefficients, two quadrature digital reference signals are used: sinkωt and coskωt, which have more...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R25/00
CPCG01R25/00
Inventor 金海彬游立胡志远彭诚
Owner BEIJING DONGFANG MEASUREMENT & TEST INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products