Fault-tolerant directory cache controller

Abstract

The invention discloses a fault-tolerant directory cache controller for the problem that a conventional directory cache is poor in fault tolerance and low in reliability, and cannot meet the requirements of a spatial environment or a complicated electromagnetic environment. The fault-tolerant directory cache controller comprises four identical directory cache bodies, a directory access bypass, a directory access crossbar switch, an access crossbar switch and a configuration register. By designing the four directory cache bodies, the configuration register, the full interconnected access crossbar switch and the directory access crossbar switch, two working modes can be flexibly configured, so that both the performance and the fault tolerance are preferred. By designing a directory access bypass module, the complete failure of a directory Cache function in a bad condition such as a space high-radiation environment is prevented, so that the reliability is enhanced. Compared with the conventional directory Cache, the fault-tolerant directory cache controller has the advantages that a multilevel fault-tolerant technology from a system structure level to a circuit design level is adopted, so that on the premise of no performance loss, the fault tolerance and reliability of the directory Cache are remarkably improved.

Description

technical field [0001] The invention relates to an on-chip multi-core microprocessor and a fault-tolerant directory cache (Cache) controller in a node control chip. Background technique [0002] In recent years, from supercomputers to personal computers, from consumer electronics to industrial control, all aspects of human production and life have been inseparable from Very Large Scale Integrated (VLSI) chips. In digital integrated circuits, logic "1" or logic "0" is expressed by holding or releasing a certain charge. Integrated circuits used in complex electromagnetic environments (such as space and nuclear power plants) are bombarded by high-energy particles or disturbed by noise, which will cause instantaneous charge and discharge, which may damage the internal state of the microprocessor and affect the reliability of the chip. Such errors, caused by high-energy particle bombardment and noise interference, are called "soft errors." Compared with the "hard errors" introd...

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Problems solved by technology

[0026] The main technical problem to be solved by the present invention is: Aiming at the traditional directory Cache having weak fault tolerance and low reliability, and unable to meet the requirements of the space environment or complex electromagnetic environment, a fa

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