Sub-micron scale glass subsurface defect detection device and method

A technology for subsurface defects and detection devices, which is used in measurement devices, instruments, scientific instruments, etc., can solve the problems of inability to obtain extended depth, inability to obtain local data, and high requirements for mechanical devices, and achieve detection sensitivity and signal-to-noise ratio. High detection sensitivity and signal-to-noise ratio, ensuring the effect of stability

Active Publication Date: 2016-08-10
NANJING UNIV OF SCI & TECH
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  • Abstract
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Problems solved by technology

The early optical coherence tomography called time-domain OCT has certain limitations: the requirements for mechanical devices are too high and the cost is too expensive
The traditional methods for judging cracks include corrosion method and surface roughness measurement method. The corrosion method destroys the shape of the crack itself, and can only determine the lateral position of the crack, but cannot obtain its extension depth; the method of measuring

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  • Sub-micron scale glass subsurface defect detection device and method
  • Sub-micron scale glass subsurface defect detection device and method
  • Sub-micron scale glass subsurface defect detection device and method

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[0048] Example 1

[0049] The supercontinuum luminescence spectrum light source 1 described in this embodiment is selected from the SC480 of Fianium, UK. The total output power of the laser is about 2w, the wavelength bandwidth is about 2000nm, and the maximum wavelength is 2400nm. The 45° cylindrical mirror 4 is NT54-092 manufactured by Edmund Optics, and its cylindrical diameter is 2 mm. Both the reference objective lens 5 and the sample objective lens 8 use Thorlabs' achromatic lens with a focal length of 10mm and a numerical aperture of 0.4. The two-dimensional scanning galvanometer 7 selects Thorlabs' GVS012 with a 10mm clear aperture. The test piece 9 is glass with sub-micron cracks on the subsurface. The transmission grating 11 is 1002-1 made by Wasatch, with a line number of 1200 and an operating wavelength of 830 nm. The focusing lens 12 is a two-inch achromatic lens from Thorlabs. The photodetector 13 selects the linear array EM2 of E2V Company.

[0050] The method f...

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Abstract

The invention discloses a sub-micron scale glass subsurface defect detection device and method. A light source part of the device comprises a super-continuum luminous spectrum light source and a single-mode optical fiber circulator; a reference arm and sample arm part comprises a first collimating lens, a 45-degree cylindrical reflecting mirror, a reference objective, a reference reflecting mirror, a two-dimensional scanning galvanometer, a sample objective and a part to be detected; a detection arm part comprises a second collimating lens, a transmission grating, a focusing lens, a photoelectric detector and a computer. The method comprises the steps that light of a reference arm and light of a sample arm return back to the single-mode optical fiber circulator in the same way, light beams of the two arms encounter, and interference is caused; interfered light beams are subjected to light splitting through the transmission grating and then focused on different pixel elements of the photoelectric detector through the focusing lens, the photoelectric detector inputs collected signals into the computer, the signals are processed, and faultage images of different positions are obtained. According to the sub-micron scale glass subsurface defect detection device and method, the ultra-wide band light source, the high-power aperture imaging objectives and the common light path imaging structure are adopted, and the three-dimensional structure of sub-micron scale glass subsurface cracks is obtained.

Description

technical field [0001] The invention relates to the technical field of optical coherence tomography (Optical Coherence Tomography, OCT), in particular to a submicron-scale glass subsurface defect detection device and method. Background technique [0002] Optical coherence tomography (Optical Coherence, OCT) is a non-invasive, non-invasive, high-resolution, high-sensitivity real-time imaging method applied to biological tissues. In 1991, the Fujimoto research group at the Massachusetts Institute of Technology used a superluminescent diode with a center wavelength of 830nm as the light source, and used an optical low coherence reflectometer (OLCR) to image biological tissues, and proposed optical coherence tomography for the first time. concept. The device is mainly based on the low-coherence imaging of Michelson interferometer, so the device uses a broadband light source, the light returned from the reference arm and the backscattered light returned from different depths of ...

Claims

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Application Information

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IPC IPC(8): G01N21/958
CPCG01N21/958
Inventor 高万荣伍秀玭张运旭郭英呈朱珊珊史伟松刘浩廖九零朱越卞海溢
Owner NANJING UNIV OF SCI & TECH
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