Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Sub-micron scale glass subsurface defect detection device and method

A technology for subsurface defects and detection devices, which is used in measurement devices, instruments, scientific instruments, etc., can solve the problems of inability to obtain extended depth, inability to obtain local data, and high requirements for mechanical devices, and achieve detection sensitivity and signal-to-noise ratio. High detection sensitivity and signal-to-noise ratio, ensuring the effect of stability

Active Publication Date: 2016-08-10
NANJING UNIV OF SCI & TECH
View PDF8 Cites 22 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The early optical coherence tomography called time-domain OCT has certain limitations: the requirements for mechanical devices are too high and the cost is too expensive
The traditional methods for judging cracks include corrosion method and surface roughness measurement method. The corrosion method destroys the shape of the crack itself, and can only determine the lateral position of the crack, but cannot obtain its extension depth; the method of measuring surface roughness can obtain the surface roughness of the glass. Thus estimating the maximum depth of glass cracks, local data cannot be obtained
The optical imaging methods used to detect glass cracks mainly include total internal reflection microscopy, confocal microscopy, etc., but due to limitations in imaging resolution and imaging depth, it is difficult to achieve sub-micron glass subsurface cracks. Three-dimensional detection of cracks of magnitude

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Sub-micron scale glass subsurface defect detection device and method
  • Sub-micron scale glass subsurface defect detection device and method
  • Sub-micron scale glass subsurface defect detection device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0049] The supercontinuum light source 1 described in this embodiment uses SC480 from Fianium Company of the United Kingdom. The total output power of the laser is about 2w, and the wavelength bandwidth is about 2000nm, and the maximum wavelength is 2400nm. The 45° cylindrical reflector 4 selects NT54-092 from Edmund Optics Company, and its cylindrical surface diameter is 2 mm. Both the reference objective lens 5 and the sample objective lens 8 are achromatic lenses with a focal length of 10 mm and a numerical aperture of 0.4 from Thorlabs. The two-dimensional scanning galvanometer 7 is GVS012 with a clear aperture of 10 mm from Thorlabs. The test piece 9 is glass with submicron cracks on the subsurface. The transmission grating 11 is 1002-1 from Wasatch Company, the number of line pairs is 1200, and the working wavelength is 830nm. The focusing lens 12 is a two-inch achromatic lens from Thorlabs. The photodetector 13 is a linear array EM2 from E2V Company.

[0050] The su...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Wavelengthaaaaaaaaaa
Bandwidthaaaaaaaaaa
Center wavelengthaaaaaaaaaa
Login to View More

Abstract

The invention discloses a sub-micron scale glass subsurface defect detection device and method. A light source part of the device comprises a super-continuum luminous spectrum light source and a single-mode optical fiber circulator; a reference arm and sample arm part comprises a first collimating lens, a 45-degree cylindrical reflecting mirror, a reference objective, a reference reflecting mirror, a two-dimensional scanning galvanometer, a sample objective and a part to be detected; a detection arm part comprises a second collimating lens, a transmission grating, a focusing lens, a photoelectric detector and a computer. The method comprises the steps that light of a reference arm and light of a sample arm return back to the single-mode optical fiber circulator in the same way, light beams of the two arms encounter, and interference is caused; interfered light beams are subjected to light splitting through the transmission grating and then focused on different pixel elements of the photoelectric detector through the focusing lens, the photoelectric detector inputs collected signals into the computer, the signals are processed, and faultage images of different positions are obtained. According to the sub-micron scale glass subsurface defect detection device and method, the ultra-wide band light source, the high-power aperture imaging objectives and the common light path imaging structure are adopted, and the three-dimensional structure of sub-micron scale glass subsurface cracks is obtained.

Description

technical field [0001] The invention relates to the technical field of optical coherence tomography (Optical Coherence Tomography, OCT), in particular to a submicron-scale glass subsurface defect detection device and method. Background technique [0002] Optical coherence tomography (Optical Coherence, OCT) is a non-invasive, non-invasive, high-resolution, high-sensitivity real-time imaging method applied to biological tissues. In 1991, the Fujimoto research group at the Massachusetts Institute of Technology used a superluminescent diode with a center wavelength of 830nm as the light source, and used an optical low coherence reflectometer (OLCR) to image biological tissues, and proposed optical coherence tomography for the first time. concept. The device is mainly based on the low-coherence imaging of Michelson interferometer, so the device uses a broadband light source, the light returned from the reference arm and the backscattered light returned from different depths of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/958
CPCG01N21/958
Inventor 高万荣伍秀玭张运旭郭英呈朱珊珊史伟松刘浩廖九零朱越卞海溢
Owner NANJING UNIV OF SCI & TECH
Features
  • Generate Ideas
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More