Structural ceramic sample dielectric performance measuring device and method thereof

Abstract

The invention belongs to the field of structural ceramic sample dielectric performance measurement technology, and relates to a structural ceramic sample dielectric performance measuring device. A microwave sintering device is internally provided with a temperature acquisition device and a sample. Two ends of the sample are provided with parallel plate capacitors. The temperature acquisition device and the sample do not contact each other. Lead wires which are introduced from the sample and the temperature acquisition device are respectively connected with a dielectric performance testing device and a temperature measuring device. A data processing system is connected with the dielectric performance testing device and the temperature measuring device. The dielectric performance testing device and the temperature measuring device respectively transmit obtained data information to the data processing system. The data processing system processes data which are transmitted from the temperature measuring device and the dielectric performance testing device, thereby obtaining the dielectric constant and the dielectric loss of the sample at different frequencies and different temperatures. The structural ceramic sample dielectric performance measuring device has advantages of simple structure, convenient operation and scientific principle. The changing rule of the structural ceramic sample dielectric performance along with the temperature can be obtained in real time.

Description

Technical field: [0001] The invention belongs to the technical field of measuring the dielectric properties of structural ceramic samples, and relates to a device and method for measuring the dielectric properties of structural ceramic samples under microwave heating conditions, in particular to a dielectric constant and dielectric properties of structural ceramic samples under high temperature and frequency conversion. Loss measuring device and method. Background technique: [0002] Structural ceramic materials have the characteristics of high strength, high hardness, corrosion resistance, and high temperature resistance. They have become an important development field for new materials and have attracted widespread attention. The main preparation processes are: powder preparation, molding, and sintering. Among them, the sintering process technology plays a vital role in the performance of the material and the cost of the product. At present, the main sintering methods inc...

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Problems solved by technology

However, there is no report on the dielectric properties of microwave combined with conventional sintered structural ceramics as a function of temperature.

[0005] At present, there are two main problems in microwave sintering. One is related to the properties of materials in microwave. Most ceramics have a critical temperature. The dielectric loss is low from room temperature to the critical temperature point, and it is difficult to heat up. Once the material When the temperature is higher than the critical temperature, the dielectric loss of the material increases sharply, the temperature rises very rapidly and even local melting occurs, forming a "hot spot", that is, at a certain temperature, the dielectric loss of the material in the microwave field will suddenly increase, resulting in thermal runaway. To crack the product, since the dielectric loss properties of various materials change with temperature, it is very important and meaningful to establish a relevant database; the second is related to the existing microwave technical conditions, the uniformity of the microwave field of the large-volume resonant cavity It is difficult to sinter large-scale products, which is also related to the dielectric loss performance of the material. It is necessary to understand the behavior of the material in the microwave field and to fully and effectively control the microwave heating process.

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