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Oxide chemical vapor deposition apparatus and oxide chemical vapor deposition method

A technology of chemical vapor deposition and oxide, which is applied in the direction of gaseous chemical plating, metal material coating process, coating, etc., can solve the problems of shortened life, damage, furnace wire failure, etc., to improve quality and uniformity, The effect of ensuring uniformity

Inactive Publication Date: 2017-02-01
广东众元半导体科技有限公司
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  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

Since the process of ZnO material needs to use oxygen and grows at high temperature, how to prevent the components on the equipment from being oxidized at high temperature, resulting in shortened life or direct damage, is an urgent problem to be solved
[0003] Different from CVD epitaxial growth of other compounds, the oxide growth reaction chamber is an oxidizing atmosphere. Under ultra-high temperature (above 1100°C) growth conditions, the temperature of the furnace filament will exceed 1400°C, or even reach 1700°C, causing the furnace filament to quickly In addition, oxide impurities may be introduced. Once the impurities diffuse into the reaction gas atmosphere, harmful doping will be caused, resulting in a decrease in the quality of epitaxial materials.

Method used

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  • Oxide chemical vapor deposition apparatus and oxide chemical vapor deposition method

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Embodiment Construction

[0018] Embodiments of the present invention are further described below in conjunction with the accompanying drawings, figure 1 is a schematic illustration of the operation of an embodiment device according to the present invention. It should be understood that the disclosed figure 1 The components of the device according to the embodiment of the present invention are highlighted, that is to say, figure 1 It is not intended to illustrate every individual component of the apparatus of the invention.

[0019] Such as figure 1 As shown, an oxide chemical vapor deposition device mainly includes: slide tube 1, gasket 2, compression ring 3, base 6, cavity outer wall 7, heater 8, central gas tube 12, heater mounting seat 9. Reaction gas inlet 15, reaction chamber flow channel 16, bottom flow channel 18, central air inlet 14, exhaust gas port 13, exhaust gas rectification hole 17, characterized in that the compression ring 3 presses the slide tube 1 through the gasket 2 Tightly fi...

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Abstract

The invention discloses an oxide chemical vapor deposition apparatus and an oxide chemical vapor deposition method. The oxide chemical vapor deposition apparatus mainly comprises a slide cylinder, a pressing ring, a slide cylinder installation ring, a base, a chamber outer wall, a heater, a center gas pipe, a heater installation seat, a reaction gas inlet, a reaction chamber flow channel, a bottom portion flow channel, a center gas inlet, a tail gas port, and a tail gas rectification hole. According to the present invention, through the central symmetrical design of the flow channel, the reaction gas flowing uniformity is ensured, and the deposition quality and the deposition uniformity are improved; and the protection gas is purged into the slide cylinder through the center gas pipe and a certain positive pressure difference with the reaction chamber flow channel is maintained, such that the gas of the reaction chamber flow channel is prevented from flowing into the slide cylinder, and the heater is protected from oxidation by the reaction gas.

Description

technical field [0001] The invention relates to the technical field of semiconductor material preparation, in particular to an oxide chemical vapor deposition device and method. Background technique [0002] The current chemical vapor deposition equipment is mainly used for the growth process of GaN and GaAs materials, and these processes are not in an oxidative atmosphere, and will not cause damage to the structural material of the equipment. II-VI group oxides such as ZnO are also mainly obtained through chemical vapor deposition equipment. ZnO, as a direct bandgap wide bandgap semiconductor material, is another popular research topic in the field of optoelectronic research after GaN, and has broad development. prospect. Since the process of ZnO material needs to use oxygen and grows at high temperature, how to prevent the components on the equipment from being oxidized at high temperature, resulting in shortened life or direct damage, is an urgent problem to be solved. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C16/40C23C16/455
Inventor 甘志银王亮沈桥刘胜
Owner 广东众元半导体科技有限公司
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