Acceleration test data automatic acquisition and analysis assessment system of analog integrated circuit

Abstract

Provided is an acceleration test data automatic acquisition and analysis assessment system of an analog integrated circuit. The system is formed by a constant temperature drying box, an analog integrated test circuit, a system controlling machine, a multichannel selector switch, and a certain-type operational amplifier, the analog integrated test circuit is connected with the system controlling machine through an I2C bus and used for signal transmission between the system controlling machine and the analog integrated test circuit, the multichannel selector switch is connected with the analog integrated test circuit through a 14PIN pin to form a test circuit for test devices, and the test devices are arranged on the multichannel selector switch and are put into a high and low temperature oven for acceleration tests. According to the system, the number of the operational amplifiers can be flexibly increased or reduced, and the adoption of the multichannel selector switch and the constant temperature drying box is flexibly selected; parameter tests of the operational amplifiers can be conducted in the normal temperature or acceleration test condition; the operation is convenient, the running is stable, the devices can be effectively protected, and the reliability and the security of the system are improved; and the system can satisfy integrated operation of various types.

Description

technical field [0001] The invention relates to an analog integrated circuit data acquisition, analysis and evaluation system, in particular to an analog integrated circuit acceleration test data automatic acquisition, analysis and evaluation system, which belongs to the field of automation technology. Background technique [0002] In recent years, my country's analog integrated circuits have developed rapidly in military systems, weapons and equipment, and large-scale automation fields, and the reliability requirements for analog integrated circuits are getting higher and higher. For a device, it is particularly important whether its performance parameters meet the requirements under the conditions of use. However, due to the large number of test parameters of the traditional integrated operational amplifier, it is necessary to manually test one by one after the test circuit is built. The result is invalid or not to be evaluated, and problems such as too much data and stati...

AI Technical Summary

Problems solved by technology

If the traditional accelerated test method of putting the integrated operational amplifier in a constant temperature drying oven and taking it out regularly to test its performance parameters is directly adopted, the problems faced are: the reliability information of the integrated operational amplifier is less available, the test time is long, and it cannot be carried out. online test etc.

At present, as many test samples as possible are often required to carry out accelerated tests. The existing integrated circuit test system cannot realize the online test of the key performance parameters of the integrated operational amplifier, nor can it realize the automatic test of multiple devices under test, which is even worse under high temperature conditions. can't be satisfied

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