Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Error Correction and Compensation Method Based on Calibration Plate in Direct Write Exposure Machine

An error correction and compensation method technology, applied in optomechanical equipment, microlithography exposure equipment, photolithography process exposure devices, etc., can solve errors, affect the quality of imaging results in different areas of exposure, different exposure parameters and alignment parameters, etc. problem, to achieve the effect of low cost, solving poor alignment, convenient and flexible use

Active Publication Date: 2018-09-28
ADVANCED MICRO LITHO INSTR INC
View PDF12 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, during the production and assembly process of the exposure machine, due to certain errors and position deviations in the mobile platform, system, and exposure components, there will be exposure parameters and alignment parameters used in different areas of the exposure substrate during debugging and measurement in the later stage. Different, there is a certain error, which affects the quality of imaging results in different areas of exposure

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Error Correction and Compensation Method Based on Calibration Plate in Direct Write Exposure Machine
  • Error Correction and Compensation Method Based on Calibration Plate in Direct Write Exposure Machine
  • Error Correction and Compensation Method Based on Calibration Plate in Direct Write Exposure Machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0035] Embodiment: In the present invention, the vertex coordinate values ​​of any two areas on the calibration plate are collected. The arbitrary areas are quadrilaterals, and the two areas have overlapping parts. The specific implementation method is as follows:

[0036] In area one, first place the calibration plate with equidistant marking points on the platform; then collect the coordinate values ​​at the vertices s1, s2, s3 and s4 of the quadrilateral formed by any position on the calibration plate through the sensor, which is recorded as: (x s1 ,y s1 ), (x s2 ,y s2 ), (x s3 ,y s3 ), (x s4 ,y s4 );

[0037] Then calculate the size expansion and contraction variation of the quadrilateral according to the figure similarity transformation model, the specific method is: the rotation angle in the figure similarity transformation is α, and the expansion and contraction of four vertices x-axis direction is (s1 x , s2 x , s3 x , s4 x ), the expansion and contraction in...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an error correction and compensation method and device based on a calibration board in a direct-writing exposure machine. The method includes the steps: firstly, acquiring vertex coordinate values of at least one arbitrary area on the calibration board; secondly, determining size expanding and shrinking variation quantity of the area corresponding to the vertex coordinate values according to a graph similarity transformation model and the vertex coordinate values; finally, performing error correction and compensation for a direct-writing exposure machine system according to the size expanding and shrinking variation quantity. According to the method, deformation of graphs of different areas is measured and corrected by the aid of the calibration board, correction and compensation of an exposure device system are achieved, so that the quality exposing imaging results of different areas are improved.

Description

technical field [0001] The invention belongs to the technical field of printed circuit board processing and manufacturing, and in particular relates to an error correction and compensation method based on a calibration plate in a direct writing exposure machine. Background technique [0002] At present, there are two types of exposure equipment for printed circuit boards: traditional projection exposure equipment and direct writing exposure equipment. The traditional projection exposure equipment will have already printed the graphics on the film negative, and transfer the graphics to the photosensitive dry film through the projection film negative; the other type is the direct writing exposure equipment, and the light beam directly scans the exposure pattern onto the photosensitive dry film. , In direct-write exposure equipment, the conversion from CAM data to laser graphics is generally completed with the help of a programmable graphics generator. Compared with traditiona...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G03F7/20
CPCG03F7/2051G03F7/70491G03F7/7055
Inventor 蔡志国朱俊伟
Owner ADVANCED MICRO LITHO INSTR INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products