A kind of cerium oxide abrasive preparation method and cmp polishing application thereof
A technology of cerium oxide and abrasives, which is applied in chemical instruments and methods, polishing compositions containing abrasives, rare earth metal oxides/hydroxides, etc., can solve the problem of low purity of cerium oxide products, uneven particle size, and difficulties in meeting CMP particle size, surface morphology and other issues, to achieve excellent polishing effect, uniform particle size, good dispersion between particles
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0018] At room temperature, a cerium oxide precursor slurry with a solid content of 5% was prepared, the slurry system contained 0.1% PAA at the same time, and the pH of the slurry system was adjusted to 2.0. The above-mentioned slurry system is subjected to ball milling until the average particle size of the cerium oxide particles reaches 50 nanometers, the ball milling is stopped, and after the ball milling, the obtained product is washed 3 times, then the washed cerium oxide is configured as a dispersed slurry with a solid content of 5%. The pH value of the dispersion system was adjusted to 2.0, and hydrothermally treated at 100° C. for 24 hours. After cooling, the cerium oxide abrasive was obtained, which could be used as an abrasive for further application in CMP polishing.
Embodiment 2
[0020] At room temperature, a cerium oxide precursor slurry with a solid content of 30% was prepared, the slurry system contained 1% PAA at the same time, and the pH of the slurry system was adjusted to 9.0. The above-mentioned slurry system is subjected to ball milling until the average particle size of cerium oxide particles reaches 300 nanometers, the ball milling is stopped, and after the ball milling, the obtained product is washed 3 times, then the washed cerium oxide is configured as a dispersed slurry with a solid content of 30%. The pH value of the dispersion system was adjusted to 4.0, and hydrothermally treated at 200° C. for 0.5 hour, and the cerium oxide abrasive obtained after cooling could be further applied in CMP polishing.
Embodiment 3
[0022] At room temperature, a cerium oxide precursor slurry with a solid content of 15% was prepared, the slurry system contained 0.5% PAA at the same time, and the pH of the slurry system was adjusted to 8.0. The above-mentioned slurry system is subjected to ball milling until the average particle size of the cerium oxide particles reaches 100 nanometers, the ball milling is stopped, and the obtained after ball milling is washed 3 times, then the washed cerium oxide is configured as a dispersed slurry with a solid content of 15%. The pH value of the dispersion system was adjusted to 2.0, and hydrothermally treated at 150° C. for 12 hours, and the cerium oxide abrasive obtained after cooling could be further applied in CMP polishing.
PUM
| Property | Measurement | Unit |
|---|---|---|
| particle size | aaaaa | aaaaa |
| particle size | aaaaa | aaaaa |
| particle size | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com


