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Radon measuring system based on semiconductor dehumidification technology

A semiconductor and measurement system technology, applied in the field of radon measuring instrument, can solve problems such as impact, achieve high collection efficiency, improve portability, and simplify operation

Active Publication Date: 2017-07-14
北京博瑞赛科技有限责任公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a radon measurement system based on semiconductor dehumidification technology to solve the problem of the influence of sample gas humidity on the radon measurement instrument by electrostatic collection method, and to achieve stable and high collection efficiency without desiccant

Method used

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  • Radon measuring system based on semiconductor dehumidification technology

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] The sample gas passes through the filter membrane 1 under the action of the sampling pump 2, passes through the condensation chamber 6, the radiator 3, reaches the electrostatic collection chamber of the measurement system 9, and then discharges it out. The measurement system 9 includes an electrostatic collection chamber, a silicon semiconductor detector, an amplifier circuit, a multi-channel analyzer, a single-chip microcomputer system, and the like.

[0031] The temperature of the condensation chamber 6 is controlled within the range of 2°C±1°C, the temperature of the sample gas drops rapidly and becomes supersaturated, and the condensed water flows into the water storage bottle 8 (the water is poured out manually when it is full). The sample gas enters the cooling chamber 3 after passing through the condensation chamber 6, the temperature rises to 40°C, and the relative humidity drops below 15%. The radiator 10 is equipped with a fan, and when the temperature of the...

Embodiment 2

[0035] The sample gas passes through the filter membrane 1 under the action of the sampling pump 2, passes through the condensation chamber 6, the radiator 3, reaches the electrostatic collection chamber of the measurement system 9, and then discharges it out. The measurement system 9 includes an electrostatic collection chamber, a silicon semiconductor detector, an amplifier circuit, a multi-channel analyzer, a single-chip microcomputer system, and the like.

[0036] The temperature of the condensation chamber 6 is controlled within the range of 1 °C ± 0.5 °C, the temperature of the sample gas drops rapidly and becomes supersaturated, and the condensed water flows into the drain pipe.

[0037] Because of the effect of the sampling pump 2, the gas pressure in the condensation chamber 6 is slightly larger than the outside of the radon measuring instrument, and the condensed water in the drain pipe will be discharged from the radon measuring instrument under the effect of the pre...

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Abstract

The invention belongs to the technical field of radon measuring instruments, and specifically relates to a radon measuring system based on a semiconductor dehumidification technology. The radon measuring system comprises a filter membrane, a sampling pump, a radiating chamber, a hot side of a semiconductor refrigeration plate, a cold side of the semiconductor refrigeration plate, a condensation chamber, a heat insulation layer, a water bottle, a measuring system, and a radiator. The condensation chamber is surface-mounted on the cold side of the semiconductor refrigeration plate, and is wrapped in the heat insulation layer. One side of the radiating chamber is surface-mounted on the hot side of the semiconductor refrigeration plate. The radiator is surface-mounted on the other side of the radiating chamber. Sample gas enters the condensation chamber through the filter membrane under the action of the sampling pump. The water bottle is connected with the condensation chamber. The radiating chamber is connected with the measuring system. The problem that the humidity of sample gas has an influence on an electrostatic collection radon measuring instrument can be solved. Stable and high collection efficiency can be achieved without desiccant.

Description

technical field [0001] The invention belongs to the technical field of radon measuring instruments, in particular to a radon measuring system based on semiconductor dehumidification technology. Background technique [0002] The electrostatic collection method is currently a very widely used method for measuring radon concentration. This method is measured by collecting the first generation of radon progeny Po-218, which requires the instrument to have high and stable collection efficiency. The Po-218 just decayed is free metal atoms, about 90% of which are positively charged, and they are collected on the surface of the detector under the action of the electric field. However, during the collection process, the positively charged Po-218 atoms easily interact with polarized water vapor molecules to become neutral particles, and the electric field loses its force on them, thus affecting the collection efficiency, so the influence of excluding humidity is An important problem ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/24
Inventor 冯威锋关键王腾飞丁海云曹放柳杰侯江
Owner 北京博瑞赛科技有限责任公司