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Gold-tin bonding method for patterned surface

A patterning and bonding technology, which is applied in the field of bonding, can solve problems such as adverse effects of subsequent processes, lowering of the photoelectric characteristics of the wafer, and difficulty in seamlessly connecting the wafer with the target substrate, so as to improve the photoelectric characteristics, reduce the influence, and enhance the The effect of mobility

Inactive Publication Date: 2017-08-29
ENRAYTEK OPTOELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a gold-tin bonding method for a patterned surface, which is used to solve the problem that it is difficult to seamlessly bond a wafer with a patterned surface to a target substrate in the prior art connection, resulting in adverse effects on subsequent processes and reducing the photoelectric characteristics of the wafer

Method used

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Embodiment Construction

[0044] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0045] see Figure 2 to Figure 6 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arb...

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Abstract

The present invention provides a gold-tin bonding method for a patterned surface. The method comprises the following steps of S1, stacking up a target substrate and a wafer between the upper and lower heating substrates of a bonding machine, wherein the to-be-bonded surface of the wafer is provided with at least one groove; the to-be-bonded surface of the target substrate is provided with a first bonding material layer used for enabling the gold-tin eutectic bonding operation; the to-be-bonded surface of the wafer is provided with a second bonding material layer used for enabling the gold-tin eutectic bonding operation; in the first and second bonding material layers, the mass ratio of the total tin is larger than 20%; S2, applying a pressure on the wafer and the target substrate by the upper heating substrate and the lower heating substrate, heating the wafer and the target substrate to a preset temperature, and bonding the wafer to the target substrate. According to the technical scheme of the invention, the seamless bonding between the wafer and the target substrate is realized, so that the influence on the subsequent processes is effectively reduced. The photoelectric characteristics of the wafer are improved.

Description

technical field [0001] The invention belongs to the bonding field and relates to a gold-tin bonding method for a patterned surface. Background technique [0002] Metal bonding technology refers to the face-to-face bonding of two chips through pure metals or alloys, relying on metal bonds, diffusion between the metal and the surface of the chip, and metal melting. Metal bonding can replace the epitaxial growth of thick epitaxial thin film materials and directly bond the required epitaxial layer materials or devices to the target substrate, thereby simplifying the device process, reducing costs, and improving the electrical and thermal conductivity of the device. [0003] The key to metal bonding is to select a suitable metal film, that is, the selected metal film should maintain good ohmic contact with the wafer material, a small diffusion coefficient, and a low metal melting point. In the metal bonding of optoelectronic devices, it is sometimes necessary to consider that th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/603
CPCH01L24/03H01L24/04H01L24/96
Inventor 方安乐徐慧文李起鸣
Owner ENRAYTEK OPTOELECTRONICS
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