Near-infrared spectral variable selection method based on Monte Carlo variable combination cluster
A technology of near-infrared spectroscopy and variable selection, which is applied in the field of near-infrared spectroscopy variable selection based on Monte Carlo variable combination clusters, which can solve the problems of less samples and more variables, the inclusion of non-informative variables and interference variables, and the impact of model prediction performance. , to achieve the effect of improving stability and reliability, reducing dependence and avoiding influence
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0026] Embodiment 1: In order to prove the applicability of the present invention, a detailed description will be given in conjunction with examples. However, the present invention can also be applied to spectral data other than the example used here.
[0027] figure 1 Be the flow chart of the near-infrared spectrum variable selection method (MC-VCPA) algorithm based on the Monte Carlo variable combination cluster provided by the invention, as seen, the present invention specifically comprises the following steps:
[0028] (1) The chemical data of 93 wheat and wheat proteins used in this research come from the Beijing Fangfude Research Center of the State Grain Administration, using the near-infrared spectrum of each wheat sample with the MCS611NIR fiber optic spectrometer from Carl Zeiss, Germany. The spectral range 950 ~ 1690nm, each experimental sample collected 3 light, take the average absorbance. Use wavelet packet (WTP) to eliminate the noise signal in the spectrum. ...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



