According to the testing device for the embedded
voltage reference and temperature sensor of the
microcontroller, a PC is used for sending a control word to a lower computer through a UART port, the lower computer receives the control word and then collects the
voltage reference of the
microcontroller of a set
station through a digital
multimeter, the temperature sensor is started to conduct temperature collection, and the temperature sensor is started to conduct
temperature measurement. A
voltage reference collected by the digital
multimeter is uploaded to the PC through the
USB port, a temperature sampling value is uploaded to the PC through the UART port by the lower computer and is distinguished, printed and stored on the PC, and
automatic testing of the embedded
voltage reference and the temperature sensor of the
microcontroller is achieved. While
automation is realized, the test device and method also consider the
mass production condition, and the lower computer controls the microcontroller to realize erasing and
programming of a self-
test program; the simultaneous measurement number of the microcontroller is increased through variable address and multi-
station hardware design; and through independent design of the lower computer and the microcontroller, the requirements of the embedded
voltage reference of the microcontroller and the full-temperature-zone
online test of the temperature sensor are met.