Fast, low-overhead and full-automatic digital integrated circuit single-particle fault injection system

Abstract

The present invention discloses a fast, low-overhead and full-automatic digital integrated circuit single-particle fault injection system. The system comprises a man-machine operation interface and a fault injector; the fault injector comprises a fault circuit netlist code generation module, a function vector and fault random signal generation module and a simulation statistics and calculation output module. With the system of the invention adopted, full automatic single-particle fault injection is realized; a process files is processed in real time, so that influence on simulation performance caused by memory explosion due to excessively large storage quantity can be avoided; and the overhead of a calculator for simulation can be reduced.

Description

technical field [0001] The invention relates to a fast and low-cost full-automatic digital integrated circuit single-event fault injection system, which belongs to the technical field of semiconductor integrated circuit anti-space single-event effect verification technology. Background technique [0002] The complex space environment contains a large number of particles (electrons, neutrons, protons and heavy ions) and rays. These radiation particles can cause single-event effects in semiconductor devices, causing disturbances or permanent failures in the state of semiconductor devices. Before digital integrated circuits are applied to aerospace equipment, it is necessary to evaluate the anti-single event performance of the internal units and nodes of digital integrated circuits on the ground. Heavy ion accelerators are usually used to simulate single event tests on the ground. In recent years, due to the reduction of the accelerator time and the increase of the cost of the...

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Problems solved by technology

[0003] The existing simulation-based single event fault injection methods for digital integrated circuits have the following two shortcomings: on the one hand, the system is not intelligent enough, and the tester needs to perform many operations manually during the single event fault injection test, which seriously affects test progress

For example: the target circuit netlist containing the fault interface cannot be automatically generated, the commonality with commercial simulation software is not good, the degree of connection with the actual space radiation is not high, and the single event fault injection cannot be automatically realized; on the other hand, due to digital integration The scale of the circuit is usually very large. An ordinary ASIC circuit has at least one million circuit nodes, and sometimes even needs to complete fault injection for all circuit nodes. Therefore, the computer performance requirements for the single event fault injection test harsh

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