Check point technology-based dual pipeline and fault tolerance method

A pipeline and checkpoint technology, which is applied to the redundancy in the operation for data error detection, response error generation, error detection/correction, etc., can solve the problems of processor performance degradation, low performance overhead, and inability to locate. Achieve the effect of reducing logic delay, increasing working frequency, and reducing complexity

Pending Publication Date: 2017-09-15
CAPITAL NORMAL UNIVERSITY
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Problems solved by technology

[0004] The existing reinforcement technology for space microprocessors has the following three schemes: the time-based fault-tolerant method can effectively solve the MBU problem, but the processor performance is greatly reduced; the code-based fault-tolerant method can only effectively verify the calculation part Correctness, and different encoding methods cannot handle all single event faults, and the fault tolerance is limited; using a hardware-based redundancy scheme, register-level triple-mode redundancy cannot cope with MBU faults; pipeline-level triple-mode redundancy , although the faulty pipeline can be located, but the overhead of hardware resources and power consumption is high; pipeline-level dual-mode redundancy can deal with MBU failures, but it cannot be located and cannot shield the faults, and the pipeline rollback will increa

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  • Check point technology-based dual pipeline and fault tolerance method
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  • Check point technology-based dual pipeline and fault tolerance method

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Embodiment Construction

[0026] This embodiment describes the specific implementation of the present invention in conjunction with an embedded microprocessor LEON2 with a SPARC V8 architecture. The embedded microprocessor LEON2 of the SPARC V8 architecture adopts a 32-bit RISC architecture, and its pipeline unit is a classic five-stage pipeline, and each pipeline stage of the pipeline performs data interaction with the instruction cache, data cache and register file.

[0027] The pipeline unit of the LEON2 processor includes five combinatorial logic units of instruction fetch (IF), decode (ID), execution (EX), memory access (ME), and write back (WR), as well as five logic units set between each pipeline stage. Group inter-level registers IF, IF / ID, ID / EX, EX / ME, ME / WR, its structure is as follows figure 1 shown. A single event bombards the combinatorial logic part of the pipeline and causes a SET failure, which may be latched by an interstage register and cause a pipeline error. A single event bomba...

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Abstract

The invention discloses a check point technology-based dual pipeline and a fault tolerance method. The check point technology-based dual pipeline is characterized by comprising a pipeline A, a pipeline B, an instruction cache (301), a backup register group (401), comparison logic (501), a write cache (601), a data cache (701) and a register file (801). According to the check point technology-based dual pipeline, contents of interstage registers of the pipelines are backed up by adopting backup registers; single event faults in pipeline units are detected through the comparison logic; and by utilizing a method for recovering the pipelines by values in the backup register group, fault tolerance is performed on SEU, SET and MBU faults caused by single event effects.

Description

technical field [0001] The invention relates to a detection and recovery device for pipeline errors of a microprocessor, in particular to a detection and recovery device for pipeline errors in a SPARC V8 processor. The invention also relates to a method for shielding data reversal errors in pipelines in a SPARC V8 processor. Background technique [0002] Single event upset (Single Event Upset, SEU) is an event in the space application environment, due to the incident of a single event, the data flip error occurs in the storage unit of the integrated circuit, and it is one of the important causes of electronic system failure and abnormal operation in the space environment. . With the rapid development of semiconductor process technology, the size of the chip is continuously reduced, the operating frequency of the processor is continuously increased, and the reduction of the operating voltage of the node makes the single event upset phenomenon more and more serious. A single...

Claims

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Application Information

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IPC IPC(8): G06F11/14G06F9/30
CPCG06F9/3012G06F11/1407Y02D10/00
Inventor 张伟功王晶申娇尚媛园朱晓燕
Owner CAPITAL NORMAL UNIVERSITY
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