Method for developing molecular marker interlocked with specific chromosome region of wheat
What is Al technical title?
Al technical title is built by PatSnap Al team. It summarizes the technical point description of the patent document.
A technology of molecular markers and chromosomes, applied in the field of agricultural biology, can solve problems such as the difficulty of developing markers for specific chromosome segments
Pending Publication Date: 2017-11-17
JIANGSU ACADEMY OF AGRICULTURAL SCIENCES
View PDF6 Cites 2 Cited by
Summary
Abstract
Description
Claims
Application Information
AI Technical Summary
This helps you quickly interpret patents by identifying the three key elements:
Problems solved by technology
Method used
Benefits of technology
Problems solved by technology
[0004] Developing markers at specific chromosomal segments remains difficult as wheat does not yet have a complete genome sequence
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more
Image
Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
Click on the blue label to locate the original text in one second.
Reading with bidirectional positioning of images and text.
Smart Image
Examples
Experimental program
Comparison scheme
Effect test
Embodiment 1
[0037] Development of molecular markers tightly linked to wheat powdery mildew resistance gene pmHYM:
[0038] 1. Obtain the sequence information of the molecular markers developed:
[0039] 1) According to the preliminary mapping results of pmHYM (Master's thesis of Zhang Zhiliang), the gene is located between the markers Xgwm611 and Xgwm577, due to Nematollahi et al. (2008, Microsatellite mapping of powdery mildew resistance allele Pm5d from common wheat line IGV1-455, Euphytica, 159, 307-313) Markers Xgwm611 and Xgwm577 were positioned in the chromosome arm of wheat 7BL 0.86-1.00, and the EST sequence positioned on the chromosome arm was used as the original sequence;
[0040] 2) Use the above-mentioned EST sequences to compare the genomes of Brachypodium, rice, and sorghum, establish the collinearity between this segment and Brachypodium, rice, and sorghum, compare the collinear relationship constructed by the corresponding segment of the 90kb SNP, and determine the Segme...
Embodiment 2
[0048] Development of Molecular Markers Tightly Linked to Wheat Powdery Mildew Resistance Gene Pm48:
[0049] 1. Obtain the sequence information of the molecular markers developed:
[0050] 1) According to the preliminary mapping results of Pm48 (Gao et al., 2012, Genetic analysis and molecular mapping of a new powdery mildew resistant gene Pm46 in common wheat, Theor ApplGenet, 125, 967-973), the gene is located between markers Xcfd81 and Xgwm205, marker Xcfd81 and Xgwm205 may be located in the chromosome arm of wheat 5DS 0.63-1.00, and the EST sequence located on the chromosome arm was used as the original sequence;
[0051] 2) Use the above-mentioned EST sequences to compare the genomes of Brachypodium, rice, and sorghum, establish the collinearity between this segment and Brachypodium, rice, and sorghum, compare the collinear relationship constructed by the corresponding segment of the 90kb SNP, and determine the Segment potential SNP markers, as raw sequences;
[0052] ...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more
PUM
Login to view more
Abstract
The invention discloses a method for developing a molecular marker interlocked with a specific chromosome region of wheat and relates to the technical field of agricultural living things. Orthologous genes determined by EST co-linear relation in wheat deletion positioning and corresponding SNP are utilized as original sequences for developing the markers, wheat genomic sequences obtained through sequence comparison and sequences obtained through sequencing serve as main sequences for developing the markers, sequence feature analysis is conducted on the obtained wheat genomic sequences and the sequences obtained through sequencing so as to design corresponding SSR, STS, CAPS and dCAPS markers; the developed markers sequentially undergo BSA analysis, genotype analysis and diagraph analysis, and the molecular marker interlocked with the specific chromosome region of wheat is obtained. By adopting the method, the shortcoming of the low density of the molecular marker of wheat is overcome, and the problem that the molecular marker of wheat in the specific chromosome region is difficult to mark is very well solved.
Description
1. Technical field [0001] The invention designs a method for developing a molecular marker linked to a specific chromosome segment of wheat, specifically in the field of agricultural biotechnology. 2. Background technology [0002] Wheat is the most important food crop in the world, and its production is related to world food security. Common wheat (Triticum aestivum L.) is an allohexaploid species containing three distinct subgenomes (A,B,D). The genome is more than 16 000Mb, containing more than 80% repetitive sequences (Flavell et al., 1974, Genome size and proportion of repeated nucleotide sequence DNA in plants, Biochem Genet, 12, 257-269), and the polymorphic rate of molecular markers is low (Bryan et al., 1999 , Low levels of DNA sequence variation among adapted genotypes of hexaploid wheat, Theor Appl Genet, 99, 192-198). [0003] With the development of experimental technology, the types of molecular markers are gradually enriched, such as the initial RFLP (restri...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more
Application Information
Patent Timeline
Application Date:The date an application was filed.
Publication Date:The date a patent or application was officially published.
First Publication Date:The earliest publication date of a patent with the same application number.
Issue Date:Publication date of the patent grant document.
PCT Entry Date:The Entry date of PCT National Phase.
Estimated Expiry Date:The statutory expiry date of a patent right according to the Patent Law, and it is the longest term of protection that the patent right can achieve without the termination of the patent right due to other reasons(Term extension factor has been taken into account ).
Invalid Date:Actual expiry date is based on effective date or publication date of legal transaction data of invalid patent.
Login to view more 
Login to view more