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Method for preferably selecting silicon material based on XRD (X-ray diffraction) and application thereof

A material, siliceous technology, applied in the field of material quality determination, can solve the problem of time-consuming and laborious, and achieve the effect of reducing energy consumption, strong applicability, and increasing production cost

Active Publication Date: 2017-11-24
CHINA BUILDING MATERIALS ACAD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In production practice, some enterprises often use different siliceous raw materials to prepare clinker and conduct experiments to distinguish the quality of raw materials, which is time-consuming and labor-intensive.

Method used

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  • Method for preferably selecting silicon material based on XRD (X-ray diffraction) and application thereof
  • Method for preferably selecting silicon material based on XRD (X-ray diffraction) and application thereof
  • Method for preferably selecting silicon material based on XRD (X-ray diffraction) and application thereof

Examples

Experimental program
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Effect test

Embodiment 1

[0049] The chemical compositions of three kinds of siliceous raw materials including quartz sand 1, high silica sandstone 2 and medium silica sandstone 3 are shown in Table 1-1. The raw materials are pulverized and finely ground, and the sieve residue with a particle size of 80 μm is controlled to be less than 10%. By slowly scanning (or increasing instrument power) etc. (the measurement condition of this embodiment is: D8ADVANCE type, X-ray diffractometer (X-ray diffraction, XRD), LynxEye one-dimensional array detector, 40kw, 250mA, Cu Kα 1，2 Diffraction, step size 0.01°, scanning speed 8° / min. ), so that in the XRD diffraction results of all samples, the diffraction peak intensity of the quartz (101) crystal plane (that is, around θ=26.64 degrees) is not less than 10,000 data points. The XRD diffraction patterns of the three siliceous raw materials are shown in figure 1 . First, calculate the ratio R of the absolute intensity of the (101) crystal plane diffraction peak to...

Embodiment 2

[0060] The chemical compositions of the four siliceous raw materials are shown in Table 2-1. Among them, the first mineral processing waste rock 6 and the second mineral processing waste rock 5 are due to SiO 2 The content is low, and it needs to be corrected by adding high-silicon raw materials. In order to avoid the influence caused by the difference in chemical composition, SiO 2 The content of chemical reagents was corrected, and the introduced amounts were 24.5% and 68.7% (mass percentage) of the total siliceous raw materials used respectively. The above-mentioned raw materials are pulverized and finely ground, and the sieve residue with a particle size of 80 μm is controlled to be below 10%. By slowly scanning (or increasing instrument power) etc. (the measuring condition of this embodiment is: D8ADVANCE type, X-ray diffractometer (X-ray diffraction, XRD), LynxEye one-dimensional array detector, 40kw, 250mA, Cu K α 1，2 Diffraction, step size 0.01°, scanning speed 8° / m...

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Abstract

The invention provides a method for preferably selecting silicon material based on XRD (X-ray diffraction) and application thereof. The measuring method comprises the following steps of grinding the silicon material; enabling an XRD diffractometer to test the material; calculating the ratio R of absolute intensity to total peak intensity at the diffraction peak of the crystal surface of quartz (101); deducting CuKalpha2 diffraction from the XRD data, removing background, and drawing a picture, so as to obtain peak position (thetaX) and half-width (detal-theta) of diffraction peak at the surface of the quartz (101), normalizing the XRD data, and calculating the integrity integer area A of the XRD diffraction peak at the surface of the quartz (101); calculating the inert coefficient Ds of the silicon material, namely Ds=R / (A*detal-theta*COSthetax). The measuring method provided by the invention has the advantages that the quality of the silicon material can be measured; the material can be reasonably selected.

Description

technical field [0001] The present invention relates to a kind of judging method of material quality, particularly relate to a kind of method and its application based on XRD preferred siliceous material. Background technique [0002] As a major high energy consumption and high emission industry in my country, the cement industry is the focus and difficulty of energy conservation and emission reduction in the industrial field. Especially since 2015, the industry has encountered the dual pressure of severe overcapacity and reduced profits, and it is imperative to improve quality and efficiency and reduce energy consumption of clinker. Silicon dioxide (SiO 2 ) is the main component of Portland cement raw meal, which is an inert component. The selection of siliceous raw materials has a decisive impact on the energy consumption of clinker firing and the quality of clinker. In the past, the selection of raw materials mainly focused on the chemical composition to meet the ingred...

Claims

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Application Information

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IPC IPC(8): G01N23/20C04B7/02
CPCC04B7/02G01N23/20G01N2223/05G01N2223/1016
Inventor 任雪红张文生叶家元董刚张洪滔汪智勇
Owner CHINA BUILDING MATERIALS ACAD
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