The method and application of optimizing siliceous materials based on xrd

A material and silicon technology, applied in the field of material quality judgment, can solve time-consuming and labor-intensive problems, achieve the effects of reducing energy consumption, reducing carbon dioxide emissions, and increasing production costs

Active Publication Date: 2019-06-25
CHINA BUILDING MATERIALS ACAD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In production practice, some enterprises often use different siliceous raw materials to prepare clinker and conduct experiments to distinguish the quality of raw materials, which is time-consuming and laborious.

Method used

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  • The method and application of optimizing siliceous materials based on xrd
  • The method and application of optimizing siliceous materials based on xrd
  • The method and application of optimizing siliceous materials based on xrd

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0049] The chemical compositions of the three siliceous raw materials including quartz sand 1, high-silica sandstone 2 and medium-silica sandstone 3 are shown in Table 1-1. The raw materials are pulverized and ground, and the particle size of 80 μm is controlled to be less than 10%. By slow scanning (or increasing the power of the instrument), etc. (the measurement conditions in this example are: D8ADVANCE type, X-ray diffractometer (XRD), LynxEye one-dimensional array detector, 40kw, 250mA, Cu Kα 1,2 Diffraction, step size 0.01°, scanning speed 8° / min. ), so that in the XRD diffraction results of all samples, the diffraction peak intensity of the quartz 101 crystal plane (ie, near θ=26.64 degrees) is not less than 10,000 data points. The XRD diffraction patterns of the three siliceous raw materials are shown in figure 1 . First, the ratio R of the absolute intensity of the diffraction peak of the 101 crystal plane to the total intensity was calculated; secondly, the XRD da...

Embodiment 2

[0060] The chemical compositions of the four siliceous raw materials are shown in Table 2-1. Among them, the first beneficiation waste rock 6 and the second beneficiation waste rock 5 are due to SiO 2 If the content is low, it needs to be corrected by adding high siliceous raw materials. In order to avoid the influence caused by the difference of chemical composition, SiO is used 2 The content of chemical reagents was corrected, and the introduced amounts were 24.5% and 68.7% (mass percentage) of the total siliceous raw materials used, respectively. The above-mentioned raw materials are pulverized and ground, and the particle size of 80 μm is controlled to be less than 10%. By slow scanning (or increasing the power of the instrument), etc. (the measurement conditions in this example are: D8ADVANCE type, X-ray diffractometer (XRD), LynxEye one-dimensional array detector, 40kw, 250mA, Cu Kα 1,2 Diffraction, step size 0.01°, scanning speed 8° / min. ), so that in the XRD diffra...

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Abstract

The invention provides a method for preferably selecting silicon material based on XRD (X-ray diffraction) and application thereof. The measuring method comprises the following steps of grinding the silicon material; enabling an XRD diffractometer to test the material; calculating the ratio R of absolute intensity to total peak intensity at the diffraction peak of the crystal surface of quartz (101); deducting CuKalpha2 diffraction from the XRD data, removing background, and drawing a picture, so as to obtain peak position (thetaX) and half-width (detal-theta) of diffraction peak at the surface of the quartz (101), normalizing the XRD data, and calculating the integrity integer area A of the XRD diffraction peak at the surface of the quartz (101); calculating the inert coefficient Ds of the silicon material, namely Ds=R / (A*detal-theta*COSthetax). The measuring method provided by the invention has the advantages that the quality of the silicon material can be measured; the material can be reasonably selected.

Description

technical field [0001] The invention relates to a method for judging the quality of materials, in particular to a method for selecting siliceous materials based on XRD and its application. Background technique [0002] As my country's main high energy consumption and high emission industry, the cement industry is the focus and difficulty of energy conservation and emission reduction in the industrial field. Especially since 2015, the industry has encountered the dual pressure of serious overcapacity and reduced profits. It is imperative to improve quality and efficiency and reduce energy consumption of clinker. Silica (SiO 2 ) is the main component of Portland cement raw meal, which is an inert component. The selection of siliceous raw materials has a decisive impact on the energy consumption of clinker sintering and the quality of clinker. In the past, the selection of raw materials mainly focused on the chemical composition to meet the requirements of ingredients, and ig...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20C04B7/02
CPCC04B7/02G01N23/20G01N2223/05G01N2223/1016
Inventor 任雪红张文生叶家元董刚张洪滔汪智勇
Owner CHINA BUILDING MATERIALS ACAD
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