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Tool for identifying and detecting positive/negative polarities of quartz crystal chip in X-direction

A positive and negative polarity, detection tool technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of cumbersome operation and low efficiency, achieve small size, easy operation, and ensure production efficiency and pass rate. Effect

Pending Publication Date: 2017-12-22
北京石晶光电科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Quartz wafer (block) needs to accurately judge the polarity of the wafer (block) during production and processing. The traditional operation method is to use X-ray irradiation to generate diffraction to judge the polarity. This method is also inefficient and cumbersome to operate.

Method used

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  • Tool for identifying and detecting positive/negative polarities of quartz crystal chip in X-direction
  • Tool for identifying and detecting positive/negative polarities of quartz crystal chip in X-direction

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Embodiment Construction

[0012] The present invention will be further described below in conjunction with the accompanying drawings.

[0013] As shown in the drawings, the present invention includes a base plate base 1, a pulsed direct current signal input electrode, an electrode pressing rod support arm 3, a micro-signal amplifier 4, a microammeter 5, an aluminum casing 6 and a battery 7, and the base plate base 1 There is a groove for placing a quartz crystal on it, the aluminum casing 6 is fixedly installed on the bottom plate base 1, the microammeter 5 is fixedly installed on the aluminum casing 6, and the electrode pressing rod support arm 3 is installed by The seat is hinged on the aluminum shell 6, the pulsed DC signal input electrode is installed on the electrode pressing rod support arm 3, the battery 7 supplies power for each component, and the input terminal of the micro signal amplifier 4 is electrically connected to the pulsed DC signal input electrode 2. connect.

[0014] The microammet...

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Abstract

A tool for identifying and detecting positive / negative polarities of a quartz crystal chip in X-direction. The invention relates to the technical field of detection of quartz crystal chips. The tool includes a base board pedestal, a pulse direct-current signal input electrode, an electrode pressing bar support arm, a micro-signal amplifier, a microammeter, an aluminum shell and a battery. The base board pedestal is provided with a groove which accommodates a quartz crystal chip. The aluminum shell is fixedly installed on the base board pedestal. The microammeter is fixedly installed on the aluminum shell. Compared with the prior art, the tool has substantive features and advantages; particularly, in the touch-type chip polarity detector, the pressing bar support arm electrode is matched with an input end of the amplifier, and the microammeter is matched with the micro-signal amplifier, so that the positive / negative polarities of the chip in the X-direction are detected when the support arm electrode touches the surface of the crystal chip. The tool has small size, is convenient and flexible, is easy to use, and is reliable and durable.

Description

technical field [0001] The invention relates to the technical field of quartz crystal plate detection, in particular to an X-direction positive and negative polarity identification and detection tool for a quartz crystal plate. Background technique [0002] During the production and processing of quartz wafers (blocks), it is necessary to accurately determine the polarity of the wafers (blocks). The traditional operation method is to use X-ray irradiation to generate diffraction to determine the polarity. This method is also inefficient and cumbersome. Therefore, it is hoped to design a polarity detection tool that is easy to operate and has high detection efficiency and will not cause damage to the wafer (block). Contents of the invention [0003] The purpose of the present invention is to solve the above-mentioned technical problems, and to provide a positive and negative polarity identification and detection tool for the X-direction of a quartz crystal wafer. [0004] ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N19/00G01R31/00
CPCG01N19/00G01R31/00
Inventor 朱中晓许建峰
Owner 北京石晶光电科技股份有限公司