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Plasma spectroscopic analysis method and plasma spectroscopic analyzer

A plasma and analysis method technology, applied in the field of plasma spectroscopic analysis and plasma spectroscopic analysis device, can solve the problems of foreign matter mixed in, analysis result changes, low analysis sensitivity, etc., and achieve the effect of suppressing analysis error and high analysis sensitivity

Inactive Publication Date: 2018-01-30
ARKRAY INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, in the method of Patent Document 1, if appropriate pretreatment is not performed, there is a problem that the analysis result changes due to the contamination of other substances.
Furthermore, in the methods of Patent Documents 2 and 3, when a sample with inclusions is used and foreign matter is mixed in the pretreatment to reduce the liquid volume of the sample, the presence of the inclusions and the The problem that the foreign matter is blocked in the narrow part and the measurement cannot be performed
In addition, in the methods of Patent Documents 4 and 5, there is a problem of low analytical sensitivity

Method used

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  • Plasma spectroscopic analysis method and plasma spectroscopic analyzer

Examples

Experimental program
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Effect test

Embodiment 1

[0099] It was confirmed that the analysis method of the present disclosure can analyze lead in a urine sample with a small deviation in a wide range of concentrations.

[0100] (1) Plasma spectroscopic analysis device

[0101] The analysis device of the above embodiment was prepared. Specifically, a bottomed columnar transparent PMMA container (35 mm in height×8 mm in width×6.5 mm in depth) was prepared. Quartz glass is placed on the side of the container 4 . The electrode 1 and the electrode 2 are arranged in the container 4 . The electrode 1 and the electrode 2 are respectively connected to a constant current unit 6 (galvanostat). The electrodes 1 and 2 are arranged horizontally with respect to the bottom surface of the container 4 . In addition, the tip of the electrode 1 is placed in contact with the quartz glass on the side surface of the container 4 . As the electrode 1, a nickel-chromium alloy electrode rod with a diameter of 0.1 mm and a length of 25 mm was used. ...

Embodiment 2

[0117] It was confirmed that the lead in the urine sample can be analyzed with little variation in different application periods.

[0118] Under the concentrating conditions of Example 1 (2), except that the application period is 0.25 seconds, 0.5 seconds, 1 second, 2 seconds, 3 seconds, 4 seconds or 8 seconds, the same as in Example 1 (2) Likewise, the count value (n=2) was measured.

[0119] The result is as image 3 shown. image 3 is a graph showing count values ​​at different cycles. exist image 3 In , the horizontal axis represents the application period, and the vertical axis represents the count value. Such as image 3 As shown, the effect was produced from the application period of 0.25 seconds, and the count value increased as the application period became longer. Also, higher count values ​​were obtained at long application periods of more than 2 seconds. From the above results, it can be seen that the analysis method of the present disclosure can analyze th...

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Abstract

The invention provides a plasma spectroscopic analysis method and a plasma spectroscopic analyzer, the analytical sensitivity is high, and for example, occurrence of analytical errors in sample analysis is suppressed. A plasma spectroscopic analysis method includes a concentration process including a voltage application period in which voltage is applied to a pair of electrodes in the presence ofa sample thereby concentrating an analyte contained in the sample in the vicinity of at least one of the pair of electrodes; and a detection process of generating a plasma by applying voltage to the pair of electrodes and detecting light emitted by the analyte due to the plasma. An electric current between the pair of electrodes is constant while applying voltage for at least a part of the duration of the concentration process.

Description

technical field [0001] The present disclosure relates to a plasma spectroscopic analysis method and a plasma spectroscopic analysis device. Background technique [0002] As a method of analyzing an analyte in a sample, an analysis method using plasma luminescence is known. Regarding the analysis method, Patent Document 1 discloses a method of analyzing a sample using a high-frequency plasma mass spectrometer. Furthermore, Patent Documents 2 and 3 disclose a method of analyzing a sample by generating plasma in a sample by using a plasma generator having a narrow portion, and analyzing plasma luminescence. In addition, Patent Documents 4 and 5 disclose methods of generating plasma in a liquid sample and analyzing the sample by analyzing plasma luminescence. [0003] However, in the method of Patent Document 1, if an appropriate pretreatment is not performed, there is a problem that the analysis result changes due to the contamination of other substances. Furthermore, in the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/66
CPCG01N1/40G01N21/67G01N21/69G01N33/483G01N2001/4038G01N33/202G01N21/73
Inventor 高须刚
Owner ARKRAY INC
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