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A kind of nitride planar structure resonant tunneling diode and its preparation method

A resonant tunneling, planar structure technology, used in diodes, semiconductor/solid-state device manufacturing, semiconductor devices, etc., can solve problems such as poor device stability, high defect density, and limited practical applications, to improve device stability and reduce technology. Difficulty, the effect of avoiding adverse effects

Active Publication Date: 2020-01-07
PEKING UNIV
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, at present, nitride-based resonant tunneling diodes face problems such as poor substrate quality, high defect density, serious leakage, and strong polarization field. The device has poor stability and low peak-to-valley current ratio, which greatly limits practical applications.

Method used

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  • A kind of nitride planar structure resonant tunneling diode and its preparation method
  • A kind of nitride planar structure resonant tunneling diode and its preparation method
  • A kind of nitride planar structure resonant tunneling diode and its preparation method

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preparation example Construction

[0049] The preparation method of the nitride planar structure resonant tunneling diode of this embodiment, such as Figure 4 shown, including the following steps:

[0050] 1) According to the theoretical calculation of the peak-to-valley current ratio and peak current density requirements of the resonant tunneling diode, the structure of the resonant tunneling diode is simulated and optimized according to the thickness of the double barrier structure and the adjustable range of the forbidden band width, Thickness and composition of emitter doped layer, emitter non-doped isolation layer, double barrier structure, collector non-doped isolation layer, collector doped layer.

[0051] 2) Pretreat the substrate to make the surface clean and directly used for epitaxial growth:

[0052] a) Soak the substrate 1 in a 30% HF solution for 10 minutes to remove the surface oxide layer, rinse it repeatedly with deionized water, and then blow it dry, then use acetone ultrasonication for 3 mi...

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Abstract

The invention discloses a resonant tunneling diode of a nitride plane structure and a preparation method for the resonant tunneling diode. The diode comprises a substrate, an emitter electrode doped layer, an emitter electrode non-doped isolation layer, a double-barrier structure, a collector electrode non-doped isolation layer, a collector electrode doped layer, an emitter electrode, a collectorelectrode, and a passivation layer. The self-aligning technology is employed in the invention, and the overexposure and overdevelopment are carried out in the preparation process of a photoresist mask, thereby reducing the junction area, reducing the number of electric leakage channels in a device, and improving the stability of the device. The emitter electrode and the collector electrode form aplane structure, thereby avoiding the adverse impact on the electrode contact from etching damages. Photoetching just needs to be carried for two times in the whole process, thereby effectively reducing the technological difficulty, and speeding up the research and development progress.

Description

technical field [0001] The invention relates to resonant tunneling diode technology, in particular to a nitride planar structure resonant tunneling diode and a preparation method thereof. Background technique [0002] As an emerging science and technology, terahertz technology has important application prospects in safety detection, material identification, secure communication, space exploration, high-precision radar, tissue biopsy, and transient spectrum research. As a two-terminal device, the resonant tunneling diode can generate negative differential resistance by using the resonant tunneling phenomenon to prepare a terahertz radiation source, and has attracted extensive attention. At present, the relatively mature RTD technology is mainly based on GaAs material. Due to the inherent performance limitation of the material, the current power only reaches the microwatt level. GaN-based resonant tunneling diodes have the advantages of high electron velocity, high breakdown ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/88H01L21/336H01L29/20
CPCH01L29/2003H01L29/66219H01L29/882
Inventor 王新强王丁沈波杨流云王平王涛陈兆营盛博文张健谭为苏娟石向阳
Owner PEKING UNIV
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