Low-temperature polysilicon thin film and method for manufacturing transistor
A technology of low-temperature polysilicon and manufacturing methods, applied in the direction of transistors, semiconductor/solid-state device manufacturing, semiconductor devices, etc., can solve the problems of reducing the semiconductor characteristics of silicon films, achieve the effects of soothing extrusion, improving protrusion problems, and reducing the number of impurities
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] Specific structural and functional details disclosed herein are representative only and are for purposes of describing example embodiments of the present application. This application may, however, be embodied in many alternative forms and should not be construed as limited to only the embodiments set forth herein.
[0031] In the description of this application, it should be understood that the terms "central", "lateral", "upper", "lower", "left", "right", "vertical", "horizontal", "top", The orientation or positional relationship indicated by "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the application and simplifying the description, rather than indicating or implying the referred device Or components must have a particular orientation, be constructed and operate in a particular orientation and therefore should not be construed as limiting the application. ...
PUM
| Property | Measurement | Unit |
|---|---|---|
| surface roughness | aaaaa | aaaaa |
| pore size | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More 


