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Substrate processing method and substrate processing apparatus

A substrate processing method and substrate technology, which are applied in the manufacture of electrical components, circuits, semiconductors/solid-state devices, etc., and can solve problems such as uneven surface tension and pattern collapse

Active Publication Date: 2021-09-14
DAINIPPON SCREEN MTG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The cause of the pattern collapse is presumed to be that the surface tension is unbalanced due to uneven residual cleaning liquid in the pattern formed on the substrate, and the pattern collapse occurs

Method used

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  • Substrate processing method and substrate processing apparatus
  • Substrate processing method and substrate processing apparatus
  • Substrate processing method and substrate processing apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0055] (constitute)

[0056] figure 1 is an internal cross-sectional view of the substrate processing apparatus 1 according to Embodiment 1 seen from the front. The substrate processing apparatus 1 constitutes a part of a batch system that performs etching, cleaning, and drying on a plurality of substrates (for example, semiconductor substrates) W, and mainly corresponds to a unit that performs drying.

[0057]This substrate processing apparatus 1 is an apparatus that supplies IPA (isopropyl alcohol) as an organic solvent to a substrate that has been rinsed (cleaned) with pure water, and dries it. The substrate processing apparatus 1 includes: a chamber 10, a processing tank 20, a holding mechanism 30, an elevating mechanism (corresponding to the "elevating apparatus" according to the present invention) 40, nozzles 51 to 55, and valves 61 to 65 for opening and closing the respective nozzles. , for supplying nitrogen to the nozzle 51 (N 2 ) gas or other inert gas supply sour...

Embodiment 2

[0088] Figure 5 is a flowchart of processing according to Embodiment 2. It should be noted, Figure 5 It is a flowchart of processing in the second half that differs from that in Embodiment 1. Figure 6 It is a figure for explaining the outline|summary of the processing procedure of Example 2. In addition, the same code|symbol as Example 1 is attached|subjected to the same process as Example 1, and description is abbreviate|omitted.

[0089] In this embodiment, after S8, the spraying of the water-repellent agent is stopped, and thereafter, the depressurization in the chamber 10 is temporarily stopped at any time ( Figure 5 , Figure 6 : S19). Accordingly, the concentration of the IPA vapor that is started to be supplied in S8 can be further increased, and the amount of IPA condensation on the surface of the substrate W can be further increased.

[0090] Thereafter, stop supplying IPA steam, start supplying inert gas and also start to depressurize the chamber 10 ( Fig...

Deformed example 1

[0093] Figure 7 It is a processing flowchart of Modification 1. It should be noted, Figure 7 It is a processing flow chart of the first half that differs from that of the first embodiment. Figure 8 It is a figure for explaining the outline|summary of the processing procedure of the modification 1.

[0094] In this modified example, stop spraying IPA steam after S5, and start spraying water-repellent agent steam ( Figure 7 , Figure 8 : S26). In this step, it is possible to shorten the time required for the IPA on the surface of the substrate W to be replaced by the water-repellent agent by switching between spraying the IPA vapor and spraying the water-repellent agent vapor.

[0095] After this, stop the injection of hydrophobic agent steam, start the injection of IPA steam ( Figure 7 , Figure 8 : S28). In this step, the time required for replacing the water-repellent agent on the surface of the substrate W with IPA can be shortened by switching between spraying ...

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Abstract

The invention provides a substrate processing method and a substrate processing device. Reduce the amount of hydrophobizing agent used for hydrophobizing treatment in drying treatment. The substrate processing method of the present invention is used to dry a substrate having a predetermined pattern formed on its surface. In addition, the substrate processing method of the present invention includes: a cleaning process, storing the cleaning liquid in a processing tank in a closed chamber and immersing the substrate in the cleaning liquid for cleaning; a decompression process, decompressing the chamber. pressure; lifting process, lifting the substrate from the cleaning solution in the treatment tank; draining process, discharging the cleaning solution from the treatment tank; hydrophobizing process, replacing the atmosphere in the chamber with a hydrophobic agent and The surface of the substrate is hydrophobized.

Description

technical field [0001] The present invention relates to a substrate processing method and a substrate processing apparatus for performing predetermined processing on a substrate such as a semiconductor wafer. Background technique [0002] The manufacturing process of a semiconductor device includes a process of immersing a substrate such as a semiconductor wafer in a treatment tank, performing an etching process and a cleaning process on the substrate, and a process of performing a drying process for removing the process liquid from the surface of the substrate. Such a process is performed by a substrate processing apparatus having a plurality of processing tanks. [0003] During the drying process, the pattern formed on the surface of the substrate may collapse. The cause of the pattern collapse is presumed to be that the surface tension is unbalanced due to uneven residual cleaning liquid in the pattern formed on the substrate, and the pattern collapse occurs. [0004] C...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/02H01L21/67
CPCH01L21/02H01L21/02057H01L21/67023H01L21/67034H01L21/6704H01L21/67028H01L21/67057H01L21/02052H01L21/67063H01L21/67161H01L21/67207H01L21/67739
Inventor 山口侑二基村雅洋
Owner DAINIPPON SCREEN MTG CO LTD