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A method to directly obtain the wavelength response of the current modulation of the distributed feedback semiconductor laser source

A distributed feedback and current modulation technology, applied in the field of laser spectroscopy, can solve the problems of reducing the timeliness of the real-time detection system, complex systems, and complex response functions, and achieve the effects of saving manpower, simple technology, and reducing the amount of calculation

Active Publication Date: 2020-01-03
SHANXI UNIV
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Problems solved by technology

However, the actual response function is much more complicated, so at present, the etalon is often used to measure the wavelength modulation response in real time, which will introduce a lot of calculations, which will make the system complicated and reduce the timeliness of the real-time detection system

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  • A method to directly obtain the wavelength response of the current modulation of the distributed feedback semiconductor laser source
  • A method to directly obtain the wavelength response of the current modulation of the distributed feedback semiconductor laser source
  • A method to directly obtain the wavelength response of the current modulation of the distributed feedback semiconductor laser source

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Embodiment Construction

[0030] The technology of the present invention will be further described below in conjunction with the accompanying drawings.

[0031] 1. If figure 1 As shown, the 32Hz scanning signal and the 16kHz modulation signal generated by the function generator (AFG3102) are connected to the laser controller (LDC-3724C) after the adder to modulate the wavelength of the distributed feedback laser (NTT, NLK1L5EAAA), The output light of the laser enters the detector (PDA10CF-EC) after passing through the etalon. The signal of the detector is connected to the computer with a 10M data acquisition card (NI Corporation, PCI-6115), and the measured value is obtained by using LabVIEW software for peak-finding calibration. Current modulation wavelength response function, ν m .

[0032] 2. A 10Ω resistor is connected to the distributed feedback laser current access line, and the laser injection current i(t) is obtained by measuring the voltage across the resistor, and the i(t) is obtained by fi...

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Abstract

The invention provides a method for directly acquiring the current modulation wavelength response of a distribution feedback semiconductor laser source, which belongs to the technical field of laser spectroscopy. The timeliness of a real-time detection system is improved. The method comprises four steps that 1 the output wavelength of the distribution feedback laser source is modulated; a functiongenerator is used to generate a 0 to 50Hz sawtooth wave scan signal and a 5k to 50kHz sine wave modulation signal; two signals are added by an adder and access a laser controller to realize the modulation of a laser; 2 kappa is defined as an amplitude-frequency response factor caused by the distribution feedback laser source; psi is a phase-frequency response factor caused by the distribution feedback laser source; intermediate transition effective current ie(t) is introduced; 3 the sawtooth wave scan signal is added to the distribution feedback laser source to determine the relationship between current and wavelength; and 4 the scanned and modulated effective current ie(t) is substituted into the relationship acquired in the third step, and then a wavelength response function output by the laser source is acquired.

Description

technical field [0001] The invention belongs to the technical field of laser spectroscopy, in particular to a method for directly obtaining the wavelength response of a semiconductor laser source for current modulation distribution feedback. Background technique [0002] In recent years, environmental problems have become the biggest factor restricting the rapid development of our country's economy, and air pollution directly affects the lives of each of us. Therefore, accurate detection of the composition and content of polluting gases in the ambient air is the key to controlling air pollution. step. Trace gas detection technology is more and more widely used in environmental gas monitoring. Accurate analysis of atmospheric composition and content is of guiding significance for determining pollution sources and judging whether emissions meet standards; in industrial production, according to the production system gas emissions Monitoring can purposefully regulate the produc...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/00H01S5/06
CPCG01M11/00H01S5/06
Inventor 马维光刘建鑫赵刚贾锁堂
Owner SHANXI UNIV
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