EMCCD blind element test system and method based on light homogenization collimator

Abstract

The invention discloses an EMCCD blind element test system and method based on a light homogenization collimator. The method comprises the following steps: firstly, establishing a light source in which output rays are parallel to each other and have the same intensity by using a bromine tungsten lamp, an optical fiber, an optical wedge controller and a light homogenization collimator; establishinga synchronous control collection system through an industrial control computer, a five-dimensional displacement platform and an image collection card; when a lens is added to the EMCCD, adjusting thedisplacement platform, so that an image formed by focusing the rays output by the light homogenization collimator through the lens is located at the center of the EMCCD; irradiating a light sensing image of the EMCCD by uniform rays within the same light intensity on all directions, and collecting an image, and respectively judging a first type of bright blind elements and a second type of brightblind elements; and irradiating the light sensing image of the EMCCD by uniform rays within the same light intensity on all directions, and judging dark blind elements, wherein the sum of the first type of bright blind elements, the second type of bright blind elements and the dark blind elements is a total number of blind elements of the EMCCD. By adoption of the EMCCD blind element test systemand method, real-time collection and processing of the image are achieved, and the real-time collection and processing of the output images of the EMCCD device are achieved.

Description

technical field [0001] The invention belongs to the technical field of imaging detector testing, in particular to an EMCCD blind element testing system based on a light homogenizing collimator and a method thereof. Background technique [0002] EMCCD (Electron Multiplying Charge Coupled Device) is a new type of photoelectric image sensor with "on-chip gain". Traditional photoelectric image sensors convert photons irradiated on the photosensitive surface into photoelectrons and then read them out through subsequent circuits. EMCCD can multiply and amplify the photoelectrons converted from photons. Compared with ordinary imaging devices, EMCCD has the characteristics of high sensitivity and all-weather work. . EMCCD has been widely used in biotechnology, national defense and military, security monitoring and other imaging fields. The blind element of EMCCD refers to the pixel on the photosensitive surface of EMCCD whose response to the photon irradiated on it is very differe...

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Problems solved by technology

[0005] At present, no manufacturer at home and abroad has launched a blind element test system for EMCCD, and there is no domestic company specializing in EMCCD blind element testing. Only a few colleges and research institutes are testing EMCCD related parameters, such as Nanjing University of Technology (Liu Jing Jing: EMCCD optoelectronic performance parameter test method research), Kunming University of Science and Technology (Yan Jia EMCCD camera digital-analog circuit and system optimization and testing), these test methods are about EMCCD photoelectric performance parameters and circuit performance parameters, and do not involve EMCCD blind The test system proposed by Liu Jingjing can complete the EMCCD photoelectric parameter test but cannot guarantee that the EMCCD is facing the exit of the integrating sphere, which will affect the test results of the blind element, and there is no research on the test method of the blind element

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