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Liquid crystal module aging test device and equipment comprising the same

A liquid crystal module, aging test technology, applied in the direction of measuring device, environment/reliability test, electrical measurement, etc., can solve problems such as single update, TFT-LCD liquid crystal module damage, equipment heating, etc.

Active Publication Date: 2018-06-01
SUZHOU HUAXING YUANCHUANG TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the number of host computers connected to TFT-LCD liquid crystal detection equipment through the USB port is limited. Generally, more than 3 sets may cause port conflicts and cannot be recognized. Moreover, the USB port +5V power supply driving capability of the host computer is also limited. When the devices are connected and driven together, the voltage will decay and the connection cannot be driven
Because of this, the current TFT-LCD liquid crystal aging signal box drive control system cannot realize simultaneous control of multiple units connected to the same PC host computer. In the update program, only a single unit can be updated, which requires a lot of time and manpower and material resources (equipment PC host computer) machine), which brings a lot of inconvenience to customers in using the equipment, and increases the labor and cost of customers
[0004] The current TFT-LCD liquid crystal module burn-in box control system does not store Flash, and cannot store big data such as BMP screens. It can only output the built-in screens stored in the FPGA. When customers need to display complex screens or pictures during testing, the current The LCD module aging box control system cannot meet the needs of customers, causing inconvenience to customers
In order to meet some complex screens of TFT-LCD customers, design engineers need to spend a lot of energy trying to find a way to implement them internally through FPGA programming, which will also occupy a lot of FPGA internal resources, and sometimes it is even impossible
The current TFT-LCD liquid crystal equipment cannot meet customer needs
[0005] The current TFT-LCD LCD module burn-in box control system can only drive Single interface modules because of fewer FPGA ports, but cannot drive Dual interface modules
When the resolution of modules in the TFT-LCD market tends to be more and more high-resolution, the previous TFT-LCD liquid crystal module burn-in box control system is stretched and cannot drive the corresponding situation.
[0006] The current TFT-LCD liquid crystal module burn-in box control system cannot monitor the voltage and current of the output port. When the crimping dislocation, device failure, etc. lead to high current or high voltage output of the device itself, the TFT-LCD liquid crystal module may be damaged. The device is damaged, or the device outputs a large current for a long time, causing the device to heat up, and there are safety hazards such as open flames.

Method used

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  • Liquid crystal module aging test device and equipment comprising the same
  • Liquid crystal module aging test device and equipment comprising the same
  • Liquid crystal module aging test device and equipment comprising the same

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Embodiment Construction

[0042] The technical scheme of the present invention will be further described below in conjunction with the accompanying drawings. The detailed description follows with reference to the accompanying drawings, which form a part hereof and, in the present invention, are shown by way of explanation of specific embodiments for carrying out the invention. It is to be understood that other embodiments may be utilized and structural or logical changes may be made without departing from the scope of the present invention. For example, features explained or described for one embodiment can be used on or in combination with other embodiments to yield a still further embodiment. It is intended that the present invention includes such modifications and variations. These examples were described with specific language, but they should not be construed as limiting the scope of the appended claims. The drawings are for explanatory purposes only and are not drawn to scale. For purposes of ...

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Abstract

The invention provides a liquid crystal module aging test device and equipment comprising the same. The device comprises a random access memory, a flash memory, a microprocessor, an FPGA and an outputinterface. The flash memory stores the display picture data of a liquid crystal module received from an upper computer. The microprocessor transmits test parameters and display screen parameters retrieved from the upper computer through the random access memory to to the FPGA. The FPGA generates a test signal according to the test parameters, reads the display picture data from the flash memory according to the display picture parameters, and transmits the test signal and the display picture data to the output interface. The output interface is used for transmitting the test signal and the display picture data to the liquid crystal module.

Description

technical field [0001] The invention relates to the field of liquid crystal displays, in particular to a liquid crystal module aging test device and equipment including the same. Background technique [0002] The current TFT-LCD (thin film transistor-liquid crystal display, thin film transistor-liquid crystal display) module burn-in box control system uses the drive signal set by USB communication to light up the TFT-LCD liquid crystal module, and edits the parameters through the host computer. And download and update relevant parameters to the TFT-LCD liquid crystal module burn-in box through USB, including the control program of the single-chip microcomputer and various parameters required by the module: module clock frequency, horizontal clock, vertical clock, timing requirements, voltage and current settings Value, switching screen time, automatic On / Off mode, aging automatic cycle mode (including three-stage single-screen fixed time, multi-screen fixed time cycle, fixed...

Claims

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Application Information

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IPC IPC(8): G09G3/00G01R31/00
CPCG01R31/003G09G3/006
Inventor 陈文源倪传周沐林严吉新殷建东
Owner SUZHOU HUAXING YUANCHUANG TECH CO LTD
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