A defect detection method, a detection image generation method, a system and a storage device
A defect detection and image generation technology, applied in image enhancement, image acquisition, image analysis, etc., can solve the problems of low detection accuracy, low contrast and definition, slow response speed, etc.
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[0073] The present invention will be further described below in conjunction with the accompanying drawings. The following examples are only used to more clearly illustrate the technical solutions of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all embodiments, and cannot limit the protection scope of the present invention with this.
[0074] Before detecting defects in electrical insulation materials, a terahertz time-domain spectroscopy system should be built first, such as figure 1 Shown is a schematic structural diagram of the terahertz time-domain spectroscopy system used in the present invention, including a femtosecond laser source, an optical fiber transmission system, a terahertz radiation source, a terahertz detector and an optical fiber delay system:
[0075] The femtosecond laser source can be a titanium sapphire femtosecond laser source, with a center wavelength of 980nm, a pulse ...
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