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Dual-optical-frequency-comb linear spectral encoding imaging method

A dual optical frequency comb and optical frequency comb technology, applied in the field of ultrafast optics, can solve problems such as difficult to achieve rapid image measurement and rapid extraction of various information, and achieve the effects of easy system installation and deployment, simple detection, and improved imaging speed

Inactive Publication Date: 2019-01-04
EAST CHINA NORMAL UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the traditional laser imaging system is mostly single-point measurement and multi-dimensional scanning of the sample to be tested is completed through moving parts, which makes it difficult to achieve rapid image measurement and rapid extraction of various information

Method used

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  • Dual-optical-frequency-comb linear spectral encoding imaging method
  • Dual-optical-frequency-comb linear spectral encoding imaging method
  • Dual-optical-frequency-comb linear spectral encoding imaging method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0039] refer to figure 2 , the repetition frequency of the optical frequency comb 101 of the signal light source and the optical frequency comb 102 of the local oscillator light source are simultaneously locked with the external atomic clock 103; the signal light generated by the optical frequency comb 101 is divided into a reference light and a probe light by a polarization beam splitter 401; the reference light passes through The quarter-wave plate 201 and the mirror 201 pass through the quarter-wave plate 201 again, pass through the polarization beam splitter 401 and combine with the probe light. The probe light enters the spectrally encoded imager through the quarter-wave plate 301 . The spectrally encoded imager consists of a transmission grating 302 and a microscope objective lens 303 . The spectrum is spatially expanded by the transmission grating 302 and focused on the sample 304 to be measured through the microscope objective lens 303 . The reflected light containi...

Embodiment 2

[0045] refer to image 3 , the repetition frequency of the optical frequency comb 101 of the signal light source and the optical frequency comb 102 of the local oscillator light source are simultaneously locked with the external atomic clock 103; the signal light generated by the optical frequency comb 101 is divided into a reference light and a probe light by a polarization beam splitter 401; the reference light passes through The quarter-wave plate 201 and the mirror 201 pass through the quarter-wave plate 201 again, pass through the polarization beam splitter 401 and combine with the probe light. The probe light enters the spectrally encoded imager through the quarter-wave plate 301 . The spectrally encoded imager consists of a prism 305 and a microscope objective 303 . The spectrum is spatially expanded by the prism 305 and focused on the sample 304 to be measured through the microscope objective lens 303 . The light transmitted through the sample to be measured passes t...

Embodiment 3

[0051] refer to Figure 4 The repetition frequency of the signal light source optical frequency comb 101 and the local oscillator light source optical frequency comb 102 is simultaneously locked with the external atomic clock 103; the signal light of the optical frequency comb 101 and the local oscillator light of the optical frequency comb 102 are simultaneously injected into the beam combiner 502. After passing through the beam combiner 502 , it is divided into a probe light and a reference light, and the two light beams include the signal light of the optical frequency comb 101 and the local oscillator light of the optical frequency comb 102 at the same time. The reference light passes through the compensation fiber, so that the optical path of the reference light is nearly equal to the optical path of the detection light. The reference light enters the photodetector 605 directly. The probe light passes through the fiber optic loop mirror 308 and the collimator 309 to perf...

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Abstract

The invention discloses a dual-optical-frequency-comb linear spectral encoding imaging method. According to the method, two optical frequency combs with locked repetition frequencies are used, and thetwo optical frequency combs output signal light and local oscillator light respectively. The signal light is divided into detection light and reference light. The detection light passes a spectral encoder to be focused on the surface of a sample to be measured, the sample to be measured is encoded, and then the sample to be measured and the local oscillator light are subjected to dual-optical-frequency-comb heterodyne interference. The reference light directly interferes with the local oscillator light. Two interference pulse signals are generated and are converted into digital signals by signal acquisition. Optical reference compensation detection jitter is used, and a sample absolute distance with high precision and high stability, a linear reflectivity and phase information are obtained. The sample is moved linearly, continuous measurement is performed, and a 3D topographic image and a 2D reflectance image with high precision are achieved. The dual-optical-frequency-comb linear spectral encoding imaging has the advantages of simple structure, high measurement speed, high precision, a large amount of information and high expansion.

Description

technical field [0001] The invention belongs to the technical field of ultrafast optics, and in particular relates to a dual optical frequency comb linear spectrum coding imaging method. Background technique [0002] In the 1980s, the emergence of non-optical scanning probe microscopy, especially atomic force microscopy, can advance the resolution of imaging to nanometer-level precision. Different types of microscope structures emerge in endlessly, but these microscopic techniques or penetration depths are very limited. Small, or can only give information on the surface of the object, and to varying degrees, there are problems such as complex system structure and harsh imaging detection environment. It is difficult to realize simultaneous measurement of multiple signals at the same time. At the same time, the refresh rate of traditional optical microscopes is directly limited by the frame number of photoelectric devices such as CCD and CMOS, making it difficult to achieve h...

Claims

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Application Information

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IPC IPC(8): G01B11/24G01B11/02G01N21/55
CPCG01B11/02G01B11/24G01N21/55
Inventor 邓泽江刘洋顾澄琳王超李文雪
Owner EAST CHINA NORMAL UNIVERSITY
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