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Device for testing spectral emissivity of material in high-temperature direction

A technology of spectral emissivity and testing device, which is applied in the field of spectral emissivity testing device in high temperature direction of materials, can solve the problems of large space occupied by ultra-high temperature heating furnace and inflexible movement mechanism, and achieves simplified structure, reduced space occupation, Avoid the effect of high temperature oxidation

Active Publication Date: 2019-02-01
AEROSPACE INST OF ADVANCED MATERIALS & PROCESSING TECH
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

When this structure measures the emissivity in the direction, when the test piece rotates in the furnace, the rotation angle of the test piece is limited due to the limitation of the heating furnace space; when the test piece moves with the heating furnace, the ultra-high temperature heating furnace It takes up a lot of space and the movement mechanism is not smart enough

Method used

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  • Device for testing spectral emissivity of material in high-temperature direction
  • Device for testing spectral emissivity of material in high-temperature direction
  • Device for testing spectral emissivity of material in high-temperature direction

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Embodiment 1

[0044] Such as figure 1As shown, a material high-temperature spectral emissivity testing device provided by an embodiment of the present invention includes a workbench 1, an electromagnetic induction heating system 10, a temperature measuring optical system and a radiation measuring optical system, a temperature measuring device 2 and a Fourier spectrometer 3, Wherein the workbench 1 is provided with a support portion for placing the test piece, the heating head of the electromagnetic induction heating system 10 passes through the workbench 1 from the underside of the workbench 1, and is located near the support portion, and can be placed on the support portion The test piece is heated. The temperature measurement optical path system is installed above the workbench, and can collect the radiation of the DUT, and transmit the collected DUT radiation to the temperature measuring device 2 . The radiation measurement optical path system is installed above the workbench through th...

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Abstract

The invention relates to the technical field of material thermophysical measurement, in particular to a device for testing spectral emissivity of a material in a high-temperature direction. Accordingto the testing device, an electromagnetic induction heating system is used for heating a to-be-tested piece; the temperature is tested in real time through a temperature measuring light path system; the radiation energy is tested through a radiation measuring light path system, and an angle, relative to the to-be-tested piece, of the radiation measuring light path system is adjusted through a rotating part, so that the spectral emissivity of the to-be-tested piece at different temperatures, different angles, and different wave bands can be continuously measured, the structure is also simplified, and the space occupation is reduced.

Description

technical field [0001] The invention relates to the technical field of measuring thermal physical properties of materials, in particular to a device for testing spectral emissivity of materials in a high temperature direction. Background technique [0002] The thermal radiation characteristics of materials change with temperature, and the radiation ability of a black body is the fourth power of its thermodynamic temperature (T 4 ) is directly proportional to the emission characteristics of the actual object and its own conditions (surface temperature, surface conditions and surface material types), not strictly related to T 4 proportional to, but still use T when calculating 4 express. The radiation energy of the same material at the same temperature, the same angle direction, and different wavelengths is different; the radiation energy at the same temperature, the same wavelength, and different angle directions will also be different. Therefore, the emissivity is usually ...

Claims

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Application Information

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IPC IPC(8): G01N21/25
CPCG01N21/25
Inventor 周金帅王阳高增华汤龙生裴雨辰赵英民
Owner AEROSPACE INST OF ADVANCED MATERIALS & PROCESSING TECH
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