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Performance test device based on anti-ferroelectric material

A test device and anti-ferroelectric technology, applied in the field of circuits, can solve the problems affecting the use effect, frequency hopping, attenuation, etc. sexual effect

Inactive Publication Date: 2019-04-05
HUANGHE S & T COLLEGE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] Due to its special polarization mode, antiferroelectrics have a unique electric field-induced phase transition, and antiferroelectric materials are always accompanied by significant changes in polarization, volume, and current during the antiferroelectric-ferroelectric phase transition process. Therefore, it is expected to be applied in the fields of high-energy storage, micro-displacement control, and adjustable pyroelectric infrared detection. Therefore, the performance test of antiferroelectric materials is relatively strict, and the polarization strength in the process of antiferroelectric-ferroelectric phase transition , volume and current changes are diverse, and with the generation of current, a magnetic field will appear, which will affect the collected information, and will cause frequency hopping to occur when the collected data signal is input to the performance test device based on antiferroelectric materials. and attenuation, seriously affecting the performance of the performance test device based on antiferroelectric materials

Method used

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Experimental program
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Effect test

Embodiment 1

[0012] Embodiment 1, a performance testing device based on antiferroelectric materials, including a signal frequency acquisition circuit, a detection and calibration circuit, and a filter compensation circuit, the signal frequency acquisition circuit uses a signal frequency collector J1 model SJ-ADC to collect data based on antiferroelectric In the electrical material performance testing device, the frequency of the data signal received by the terminal is controlled, and the clamp circuit composed of diode D2 and diode D3 is used to clamp the signal within 0-+5V. The detection and calibration circuit is divided into two circuits to receive the signal frequency acquisition circuit For the output signal, the capacitor C2 is used to filter out the noise of the low-frequency signal, and the peak signal is filtered out by the detection circuit composed of the operational amplifier AR1 and the operational amplifier AR2. At the same time, the triode Q2 and capacitor C3 are used to fil...

Embodiment 2

[0015] Embodiment 2, on the basis of Embodiment 1, the filter compensation circuit uses the inductance L2, the resistor R17, the capacitor C7, and the capacitor C8 to form the clutter in the output signal of the filter circuit and output it to filter out the clutter in the signal, and also That is to compensate the data signal potential received by the control terminal in the performance test device based on antiferroelectric materials to prevent signal attenuation. One end of the inductor L2 is connected to one end of the resistor R16, resistor R17, and capacitor C7, and the other end of the resistor R16 is connected to the transistor Q5. Emitter, the other end of inductor L2 is connected to one end of inductor L3 and one end of capacitor C8, the other end of resistor R17, capacitor C7, and capacitor C8 is grounded, the other end of inductor L3 is connected to one end of resistor R18, and the other end of resistor R18 is connected to the signal output port.

[0016] Implement...

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Abstract

The invention discloses a performance test device based on an anti-ferroelectric material. The performance test device comprises a signal frequency collection circuit, a wave detection calibration circuit and a wave filtering compensation circuit, wherein the signal frequency collection circuit uses a signal frequency collector J1 with the model of SJ-ADC for collecting data signal frequency received by a control terminal in the performance test device based on the anti-ferroelectric material; the wave detection calibration circuit is divided into two paths to receive signals output by the signal frequency collection circuit; a first path uses a capacitor C2 to filter away noise of low-frequency signals; a second path uses a triode Q2 and a capacitor C3 to filter away noise in high-frequency signals; finally the first path of signals and the second path of signals are input into the in-phase input end of an operation amplifier AR3; the wave filtering compensation circuit uses an inductor L2, a resistor R17, the capacitor C7 and a capacitor C8 for forming a wave filtering circuit to filter away noise waves in output signals; then, output is performed; the signals can be subjected tofrequency modulation and voltage stabilization in real time by using data signal frequency received by the control terminal in the performance test device based on the anti-ferroelectric material; and the signal distortion is prevented.

Description

technical field [0001] The invention relates to the field of circuit technology, in particular to a performance testing device based on antiferroelectric materials. Background technique [0002] Due to its special polarization mode, antiferroelectrics have a unique electric field-induced phase transition, and antiferroelectric materials are always accompanied by significant changes in polarization, volume, and current during the antiferroelectric-ferroelectric phase transition process. Therefore, it is expected to be applied in the fields of high-energy storage, micro-displacement control, and adjustable pyroelectric infrared detection. Therefore, the performance test of antiferroelectric materials is relatively strict, and the polarization strength in the process of antiferroelectric-ferroelectric phase transition , volume and current changes are diverse, and with the generation of current, a magnetic field will appear, which will affect the collected information, and will ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 高景霞孙彩霞李慧张金平张洋洋
Owner HUANGHE S & T COLLEGE
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