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Infrared Thermal Wave Nondestructive Testing Device and Method Considering Rising and Falling Edges of Pulsed Thermal Excitation Signal

An infrared thermal wave and non-destructive testing technology, applied in infrared thermal wave non-destructive testing, considers the rising edge and falling edge of the pulse thermal excitation signal in the field of infrared thermal wave non-destructive testing, which can solve the problem of uneven surface heating

Active Publication Date: 2020-07-07
HARBIN UNIV OF COMMERCE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In order to consider the impact of the rising edge and falling edge of the pulse signal on the surface of the test piece, improve the problem of uneven heating of the surface in the pulse infrared thermal imaging method, reduce the image noise interference collected by the infrared thermal imager, and consider the halogen in the actual problem The delay phenomenon of the lamp excitation source from the start of heating to the rated heating to the stop of heating, the invention provides an infrared thermal wave non-destructive testing device and method considering the rising and falling edges of the pulse thermal excitation signal

Method used

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  • Infrared Thermal Wave Nondestructive Testing Device and Method Considering Rising and Falling Edges of Pulsed Thermal Excitation Signal
  • Infrared Thermal Wave Nondestructive Testing Device and Method Considering Rising and Falling Edges of Pulsed Thermal Excitation Signal
  • Infrared Thermal Wave Nondestructive Testing Device and Method Considering Rising and Falling Edges of Pulsed Thermal Excitation Signal

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specific Embodiment approach 1

[0046] Specific Embodiment 1: This embodiment provides an infrared thermal wave nondestructive testing device that considers the rising and falling edges of the pulsed thermal excitation signal, such as figure 1 As shown, the device includes an infrared thermal excitation source, an infrared thermal excitation control system, an infrared acquisition device, a cooling device, and an infrared image receiving and processing device, wherein:

[0047] The heating source of the infrared thermal excitation source is the first halogen lamp 12 and the second halogen lamp 19, the excitation signal is a long pulse wave, and the tested object 3 is facing the thermal imaging camera 9, the first halogen lamp 12 and the second Halogen lamps 19 are horizontally inclined from 30° to 50° and placed on the left and right sides of the thermal imager 9, and the first lampshade 7 and the second lampshade 18 are used to gather the light emitted by the first halogen lamp 12 and the second halogen lamp...

specific Embodiment approach 2

[0056] Specific embodiment 2: This embodiment provides a method of using the device described in specific embodiment 1 to realize the infrared thermal wave non-destructive detection method considering the rising edge and falling edge of the pulse thermal excitation signal. The specific implementation steps of the method are as follows:

[0057] The first step: arrange each component in the device described in Embodiment 1 in order, set up the test bench 1, fix the test piece 3 in the glass cover 12 with the test piece fixture 2, and the test piece fixture 2 is in the glass cover 12. Move the front and rear positions on the moving guide rail 2-1, move the base 2-2, and keep the front and rear distance between the position of the test piece 3 on the moving guide rail 2-1 and the lens of the infrared thermal phase instrument 9 at about 30cm to 50cm, preferably It is 50cm.

[0058] Step 2: Rotate the first nut 2-6, adjust the positions of the first slider 2-4 and the second slider...

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Abstract

The invention discloses an infrared thermal wave non-destructive detection device considering the rising edge and the falling edge of a pulse thermal excitation signal and a method. The device comprises an infrared thermal excitation source, an infrared thermal excitation control system, an infrared acquisition device, a cooling device and an infrared image receiving processing device; the heatingsources of the infrared thermal excitation source are halogen lamps, and the number of the halogen lamps is two; the infrared thermal excitation control system is composed of a data acquisition card,a controller, a D flip-flop, a power amplifier, and a halogen lamp driver; the infrared acquisition device is composed of an infrared thermal imager and a thermal imager lifting platform; the coolingdevice is composed of an electric fan and a motor driver; and the infrared image receiving and processing device is a computer. According to the infrared thermal wave non-destructive detection deviceof the invention and the method, the influence of the rising edge and the falling edge of the pulse signal on the surface of a component under test is considered, the phenomenon of uneven surface heating of a pulse infrared thermal imaging method during the heating of the component under test can be alleviated, the interference of image noises is decreased, and the signal to noise ratio of an infrared image can be improved.

Description

technical field [0001] The invention belongs to the field of nondestructive testing, and relates to an infrared thermal wave nondestructive testing method, in particular to an infrared thermal wave nondestructive testing method considering the rising edge and falling edge of a pulse thermal excitation signal. Background technique [0002] With the rapid development of industrialization such as automobile manufacturing and aerospace, metal materials, non-metal materials and composite materials have been more widely used. During the preparation, processing, and service of these materials, defects such as friction, wear, cracks, and debonding will inevitably occur. If they are not detected and diagnosed in time, it will affect the performance of related parts, and even cause operational safety, triggering production failures. safety and accidents. Commonly used non-destructive testing technologies mainly include ultrasonic testing, penetrant testing, eddy current testing and r...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N25/72
Inventor 卜迟武刘国增张喜斌晏祖根
Owner HARBIN UNIV OF COMMERCE