A method for judging the assembly result of preferred orientation of anisotropic nanocrystals
A technology of nanocrystals and crystal orientation, which is applied in the direction of measuring devices, instruments, scientific instruments, etc., and can solve the problems of crystal anisotropy information identification error, large sample volume, etc.
Active Publication Date: 2020-11-17
ZHEJIANG UNIV
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[0004] However, this type of method mainly has the following defects: 1) what is obtained is the macroscopic average information of the crystal anisotropy characteristics, and the corresponding orientation information cannot be given according to the intuitive morphology of the crystal; 2) the crystal anisotropy information at the nanometer size There is a large error in the identification; 3) a large amount of sample is required (XRD generally requires at least 2mg of solid powder)
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[0045] In this example, the anisotropic Fe 3 o 4 Taking the determination of the preferred orientation assembly result of the triangular nano-thin prism structure as an example, the thickness of the nano-crystal structure is about 4.1 nm, and the side length of the triangle is about 27.5 nm.
[0046] Determining the assembly result of its preferred orientation comprises the following steps:
[0047] 1. Fe 3 o 4 Determination of shape information of triangular nano-thin prisms:
[0048] The purified Fe 3 o 4 The nanoparticles were dispersed with hexane, and a small amount of the solution was pipetted with a capillary and dropped onto a copper grid covered with an ultra-thin carbon film. The copper grid was loaded into the sample holder of the electron microscope and inserted into the lens tube of a transmission electron microscope (Hitachi HT7700). Set the accelerating voltage to 100kv, adjust parameters such as focal length and astigmatism to keep the image clear, select a...
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Abstract
The invention relates to the technical field of electron microscope testing of material products, and discloses a method for judging an optimal orientation assembly result of an anisotropic nanocrystal. The method includes the following steps: (1) obtaining a morphology image of a nanocrystal by a transmission electron microscope, and determining three-dimensional morphology information of different crystal orientations; (2) obtaining high-resolution transmission electron microscope images of nanocrystals with the different crystal orientations, and determining crystal structure information ofthe different crystal orientations; (3) obtaining electron diffraction information of nanocrystal assembly bodies in which each of the crystal orientations is repeatedly arranged, and establishing acorrespondence relationship between the electron diffraction information and dominant crystal plane arrangement information; and (4) obtaining the electron diffraction information of a to-be-detectednanocrystal assembly body by electron diffraction analysis, and judging a dominant crystal orientation of the to-be-detected nanocrystal assembly body according to the electron diffraction information, thereby judging the optimal orientation assembly result of the nanocrystal. The method of the invention can quickly judge an assembly direction and an assembly tendency by utilizing the transmissionelectron microscope.
Description
technical field [0001] The invention relates to the technical field of electron microscope testing of material products, in particular to a method for judging the assembly result of the preferred orientation of anisotropic nanocrystals. Background technique [0002] The anisotropy of the crystal means that along different directions of the crystal lattice, the periodicity and density of atomic arrangement are not the same, which leads to different physical and chemical properties of the crystal in different directions. [0003] For the characterization of the anisotropic structural information, X-ray diffraction (XRD) is usually selected, for example, the peak intensity and relative peak intensity ratio of different diffraction peaks in the XRD pattern can be compared with the relevant data on the powder diffraction standard card , or use the Scherrer formula to analyze the sizes of different crystal planes, and further draw corresponding judgments. [0004] However, this t...
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IPC IPC(8): G01N23/04G01N23/207
Inventor 陈芳丁晓坤裘雅渔姜茂蔚
Owner ZHEJIANG UNIV