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A fast switching emissivity measuring device and measuring method

A technology of fast switching and measuring devices, applied in the field of emissivity detection, can solve problems such as pollution, misalignment, damage to test parts and standard parts, etc., to achieve accurate and fast measurement, avoid back and forth replacement, simple structure and low cost

Active Publication Date: 2021-07-23
SHANGHAI SPACEFLIGHT INST OF TT&C & TELECOMM
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The emissivity of the antenna coating ensures that the emissivity of the coating on the working surface of the antenna meets the requirements of use. It is necessary to conduct a high-precision test on the emissivity of the coating in the working frequency band. Usually, the microwave radiometer equivalent noise temperature test method is used, that is, through the waiting time The test piece is compared with the standard piece to calculate the emissivity of the test piece. Among them, the test piece and the standard piece need to be replaced manually, and the test piece needs to be switched back and forth many times under this test method. This replacement method It may also cause measurement problems such as damage, pollution, and misalignment of the DUT and standard parts

Method used

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  • A fast switching emissivity measuring device and measuring method
  • A fast switching emissivity measuring device and measuring method
  • A fast switching emissivity measuring device and measuring method

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Embodiment 1

[0033] see Figure 1 to Figure 3 , the present embodiment provides a fast switching emissivity measurement device, including: a source body 6, a switching bracket 2, an ellipsoid mirror 5, a radiation receiving unit 4, and a data processing unit 3;

[0034] The switching bracket 2 is used for fixing the standard part 71 and the test part 72 and quickly switching the positions of the standard part 71 and the test part 72;

[0035] The source body 6 is used to emit thermal radiation signals and cold radiation signals to the standard part 71 or the test part 72; the ellipsoidal mirror 5 is used to focus the thermal radiation signals and cold radiation signals reflected by the standard part 71 or the test part 72 The radiation receiving unit 4 is used to receive the thermal radiation signal or the cold radiation signal focused by the ellipsoidal mirror 5 and convert it into a cold and hot radiation voltage value signal; the data processing unit 3 is used to calculate the DUT accor...

Embodiment 2

[0052] This embodiment provides an emissivity measurement method, which is applicable to the fast-switching emissivity measurement device in Embodiment 1, comprising the following steps:

[0053] The source body 6 acts as a heat source in a stable state without filling liquid nitrogen, and emits thermal radiation signals. By switching the positions of the standard part 71 and the test part 72, the standard part 71 and the test part 72 respectively receive the thermal radiation signals sent by the source body 6 And reflected to the ellipsoidal mirror 5, the ellipsoidal mirror 5 focuses the reflected thermal radiation signal, the radiation receiving unit 4 receives the thermal radiation signal focused by the ellipsoidal mirror 5 and converts it into an electrical signal, and obtains the first corresponding to the standard part 71 Thermal radiation signal voltage value V r0 The second heat radiation signal voltage value V corresponding to the DUT 72 r1 ;

[0054] The source bod...

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Abstract

The invention discloses a fast switching emissivity measuring device and a measuring method. The device comprises: a source body, a switching bracket, an ellipsoid mirror, a radiation receiving unit, and a data processing unit; Fixed and rapid switching of the position of both the standard part and the test part; the source body is used to emit thermal radiation and cold radiation to the standard part or the test part; the ellipsoidal mirror is used to reflect the thermal radiation and the The cold radiation is focused; the radiation receiving unit is used to receive the hot or cold radiation focused by the ellipsoidal mirror and convert it into a cold and hot radiation voltage value signal; the data processing unit is used to calculate the DUT according to the cold and hot radiation voltage value signal. emissivity; wherein, the switching support includes a rotating support and a positioning base, the rotating support is set on the positioning base, and the rotating support rotates around the rotation axis of the rotating support to switch the positions of the standard part and the test part , the positioning base is provided with a positioning piece, and the positioning piece is used for positioning the rotation position of the rotating support.

Description

technical field [0001] The invention belongs to the technical field of emissivity detection, and in particular relates to a fast-switching emissivity measurement device and a measurement method. Background technique [0002] Microwave radiometer is a passive microwave remote sensing equipment, which is mainly used in meteorology, agriculture, forestry, geology, marine environment monitoring and military reconnaissance. It does not emit electromagnetic waves itself, but detects the characteristics of the target by passively receiving microwave energy radiated by the observed scene. After the signal received by the antenna is amplified, filtered, detected and re-amplified, it is given in the form of voltage. The output voltage of the microwave radiometer is temperature-absolutely calibrated, that is, after the relationship between the output voltage and the apparent temperature of the antenna is established, the apparent temperature of the antenna can be determined, and the b...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00
CPCG01J5/0003
Inventor 李宁杰李贝贝刘瑞杨永键李向芹谢振超徐红新翁艺航姜丽菲钱志鹏
Owner SHANGHAI SPACEFLIGHT INST OF TT&C & TELECOMM