Clamping tool for pin protection type diode test

Abstract

The invention discloses a clamping tool for a pin protection type diode test. The clamping tool comprises a diode body, two pins, a positioning sheet, and a working bench. Two clamping holes are symmetrically disposed in the positioning sheet, clamping mechanisms used for fixing the pins are arranged on two sides of each clamping hole, each clamping mechanism comprises a movable claw, each movableclaw is fixedly connected with a transmission disc, each movable claw is engaged with a ratchet wheel, and a reversing device used for limiting the rotation direction of the ratchet wheel is arrangedbelow each ratchet wheel. The clamping tool is novel in structure, the pins of the diode are subjected to elastic force of the rubber ring in the clamping process instead of shearing force or mechanical clamping effect, the pins are not easy to damage, the clamping force can be automatically increased after the diode is electrified, and the detection result is prevented from being influenced dueto shaking or vibration of an object.

Description

technical field [0001] The invention relates to the technical field of testing electronic components, in particular to a clamping tool for pin protection type diode testing. Background technique [0002] At present, the most important device used in the field of single-photon detectors is the avalanche photodiode, which is a photovoltaic detector element used in the field of light detection. Its main function is to convert optical signals into electrical signals for output. The characteristics of sensitivity, high gain and fast response speed have become the first choice for signal detection devices in optical communications. The biggest advantage of avalanche photodiodes is their amplification effect. The photodetectors made of them have high sensitivity. In order to test avalanche photodiodes The working performance of the diode, the avalanche photodiode is usually fixed on the printed circuit board. [0003] The existing fixing method is usually to directly weld the APD ...

AI Technical Summary

Problems solved by technology

[0003] The existing fixing method is usually to directly weld the APD on the drive circuit to test the avalanche photodiode, but the welding method is not conducive to the multiple disassembly and assembly of the diode, and even the device will be damaged during the disassembly process. Therefore, we A non-welding fixing method is needed to fix the diode to facilitate the next device test, such as an electronic component test fixture described in the authorized patent CN107807318A, which uses two magnets to make the splint and the drive circuit board generate mutual shear. The trend of cutting, and then the pins of the component under test are clamped by the splint and the hole wall of the via hole on the driver circuit board, but this method will bend the pin while clamping the pin of the component, if the magnet Excessive magnetic force may even lead to breakage of the pin, which is not worth the loss. Therefore, we propose a clamping tool for pin protection diode testing

Images