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A clamping tool for pin protection type diode test

A technology for clamping tooling and diodes, which is used in measurement devices, measurement device housings, and single semiconductor device testing. Effect

Active Publication Date: 2021-12-10
深圳市研测科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The existing fixing method is usually to directly weld the APD on the drive circuit to test the avalanche photodiode, but the welding method is not conducive to the multiple disassembly and assembly of the diode, and even the device will be damaged during the disassembly process. Therefore, we A non-welding fixing method is needed to fix the diode to facilitate the next device test, such as an electronic component test fixture described in the authorized patent CN107807318A, which uses two magnets to make the splint and the drive circuit board generate mutual shear. The trend of cutting, and then the pins of the component under test are clamped by the splint and the hole wall of the via hole on the driver circuit board, but this method will bend the pin while clamping the pin of the component, if the magnet Excessive magnetic force may even lead to breakage of the pin, which is not worth the loss. Therefore, we propose a clamping tool for pin protection diode testing

Method used

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  • A clamping tool for pin protection type diode test
  • A clamping tool for pin protection type diode test
  • A clamping tool for pin protection type diode test

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Embodiment Construction

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention.

[0027] refer to Figure 1-5 , a clamping tool for pin-protected diode testing, including a diode body 12, a positioning piece 11 and a workbench 18, two pins 2 are provided at the lower end of the diode body 12, and two pins 2 are symmetrically opened on the positioning piece 11. Clamping holes 13 and four mounting grooves, and the two corresponding mounting grooves are located on both sides of the corresponding clamping holes 13, and each mounting groove is provided with a clamping mechanism for fixing the pin 2;

[0028] Each clamping mechanism includes a movable claw 1, and each movable claw 1 is fixedly connected with a transmission disc, and each movable claw 1 ...

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Abstract

The invention discloses a clamping tool for pin protection type diode testing, which comprises a diode tube body, two pins, a positioning piece and a workbench. Two clamping holes are opened symmetrically on the positioning piece, and each clamping Both sides of the holding hole are provided with clamping mechanisms for fixing the pins, each of the clamping mechanisms includes a movable claw, each of the movable claws is fixedly connected with a transmission disc, and each of the movable claws is engaged with a ratchet , a reversing device for limiting the rotation direction of the ratchet is provided below each ratchet. The invention has a novel structure. During the clamping process, the pins of the diode are subjected to the elastic force of the rubber ring, rather than shearing force or mechanical clamping action. Increase to avoid the detection results being affected by the shaking or vibration of the object.

Description

technical field [0001] The invention relates to the technical field of testing electronic components, in particular to a clamping tool for pin protection type diode testing. Background technique [0002] At present, the most important device used in the field of single-photon detectors is the avalanche photodiode, which is a photovoltaic detector element used in the field of light detection. Its main function is to convert optical signals into electrical signals for output. The characteristics of sensitivity, high gain and fast response speed have become the first choice for signal detection devices in optical communications. The biggest advantage of avalanche photodiodes is their amplification effect. The photodetectors made of them have high sensitivity. In order to test avalanche photodiodes The working performance of the diode, the avalanche photodiode is usually fixed on the printed circuit board. [0003] The existing fixing method is usually to directly weld the APD ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04G01R31/26
CPCG01R1/0425G01R31/2601
Inventor 尹冬至张晓静宋芹
Owner 深圳市研测科技有限公司