Data acquisition and processing system of elliptic curved crystal spectrometer

A technology of data acquisition and elliptical bending, which is applied in image data processing, instrumentation, X-ray energy spectrum distribution measurement, etc., and can solve the problems of insufficient detection accuracy and ability to resist interference from the test environment.

Inactive Publication Date: 2019-12-20
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0003] The invention provides a data acquisition and processing system for an elliptical curved crystal spectrometer, which solves the technical problems of the existing data acquisition and transmission system in terms of sampling speed, resolution, detection a

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  • Data acquisition and processing system of elliptic curved crystal spectrometer
  • Data acquisition and processing system of elliptic curved crystal spectrometer
  • Data acquisition and processing system of elliptic curved crystal spectrometer

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[0058] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, under the condition of not conflicting with each other, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0059] In the following description, many specific details are set forth in order to fully understand the present invention. However, the present invention can also be implemented in other ways different from the scope of this description. Therefore, the protection scope of the present invention is not limited by the following disclosure. limitations of specific examples.

[0060] The specific implementation of the hardware part of the data acquisition and processing system of the elliptical crystal spectrometer according to the pre...

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Abstract

The invention discloses a data acquisition and processing system of an elliptic curved crystal spectrometer. The system comprises a CCD photoelectric conversion module, an AD application module at ananalog front end, an FPGA driving and controlling module, a USB interface transmission module and a system power supply module. The system obtains a spectral image of a laser plasma X-ray, realizes data communication with a PC through the USB interface transmission module, and displays the transmitted data on the PC. The system can acquire image data with different frame frequencies and differentresolutions in real time and at high speed, and transmit and display the acquired data in real time, and the system obtains a higher signal-to-noise ratio and a good visual effect for the spectral image by using wavelet transformation and a median filtering algorithm. The system obtains a spectral diagram of the X-ray by using the denoised spectral image, and converts the relation between pixels and light intensity into the relation between wavelength and intensity through wavelength calibration, so that the spatial resolution of the elliptic curved crystal spectrometer is obtained, and the temperature and the rotating speed of the plasma are obtained.

Description

technical field [0001] The invention relates to the field of image data collection and processing, in particular to a data collection and processing system for an elliptical curved crystal spectrometer. Background technique [0002] In high-temperature plasma, due to the abnormal high temperature and its complex electromagnetic field, various complex magnetic fluid processes and various forms of radiation are generated, and the components in the plasma experience very complicated particle and energy transport processes and various interaction processes. To truly understand the internal state and change process of high-temperature plasma, it is necessary to use certain experimental methods to analyze the temperature, density, ionization distribution, time-space distribution of current and electromagnetic field in the plasma, as well as the state of transport, fluctuation and instability. parameters are experimentally measured, i.e. plasma diagnostics. For plasma diagnostics...

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Application Information

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IPC IPC(8): G01T1/36G06T5/00G06T7/00
CPCG01T1/36G06T5/002G06T7/0004G06T2207/10016G06T2207/10024G06T2207/20064G06T2207/30108
Inventor 李阿红吴丹阳王彬蒙林李海龙殷勇袁学松
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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