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Memory Diagnostic Data Compression Method Based on Identifying Dynamic Failure Modes

A technology for diagnosing data and failure modes, which is applied in the field of compression and transmission of diagnostic data, can solve the problems of repeated redundancy of diagnostic data and reduce output efficiency, and achieves the effect of reducing time consumption and improving output efficiency.

Active Publication Date: 2021-06-01
TIANJIN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

When row and column faults are encountered, the redundant redundancy of diagnostic data for the same fault greatly reduces the output efficiency

Method used

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  • Memory Diagnostic Data Compression Method Based on Identifying Dynamic Failure Modes
  • Memory Diagnostic Data Compression Method Based on Identifying Dynamic Failure Modes
  • Memory Diagnostic Data Compression Method Based on Identifying Dynamic Failure Modes

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Embodiment approach

[0026] The present invention will be further described in detail below in conjunction with the accompanying drawings and examples. This example is limited to illustrate an implementation method of the present invention, and does not represent a limitation to the scope of coverage of the present invention. figure 1 It is a schematic diagram of memory failure in the present invention. figure 2 is a graph of diagnostic data for different failure modes in the present invention. image 3 It is a simple block diagram of the diagnostic data compressor in the present invention. Figure 4 is a comparison chart of compression ratios for different compression designs. The compression ratio of the present invention is measured using the data bit ratio:

[0027] CR=(N s L s +N c L c +N r L r ) / (N f L f )

[0028] Among them, the compression rate CR is defined as the ratio of the number of diagnostic data bits output by compression to the number of diagnostic data bits output b...

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Abstract

The invention relates to a memory diagnosis data compression method based on identifying dynamic failure modes, comprising: memory setting; using a March algorithm capable of detecting dynamic failures to detect storage units one by one; identifying failure modes and classifying failure storage units; Determine the composition of diagnostic data in different modes. The diagnostic data consists of four parts, namely fault address, session number, compression correction code and valid bit; diagnostic data compression; serial output of diagnostic data through the port or transmission of diagnostic data to the memory for repair module; in the stage of compressed diagnostic data output, the correction code stored in the addressable memory is read unit by unit to the input and output registers, and then the data in the input and output registers are output bit by bit; finally, including fault address, read status, Diagnostic data of correction codes and valid bits are output serially through the input and output ports.

Description

technical field [0001] The invention belongs to the field of integrated circuit testing, and relates to the compressed transmission of diagnostic data in an embedded memory using built-in self-test (Built in Self-Test, BIST) technology. Background technique [0002] With the improvement of the technology level of microelectronics, the proportion of embedded memory in the system-on-chip is constantly increasing; because memory manufacturing is very sensitive to process defects, the yield of memory dominates the chip output. In order to ensure the yield of memory, built-in self-test (BIST) technology is widely used in testing and diagnosing embedded memory, BIST provides a simple and low-cost method, and will not affect memory performance. For fault analysis, BIST circuits often need to output diagnostic data to automatic test equipment. Due to the limitation of the input and output interface of the test circuit, the BIST circuit usually outputs the diagnostic data serially. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/10G11C29/12
CPCG11C29/10G11C29/12
Inventor 马永涛陈佳楠
Owner TIANJIN UNIV