Optical power monitoring unit and optical power monitoring device for ultrahigh-temperature aging test

A technology for optical power monitoring and aging testing, which is applied in the direction of photometry, diode testing, and single semiconductor device testing using electrical radiation detectors. The effect of lowering temperature, increasing service life, and increasing distance

Pending Publication Date: 2020-02-28
武汉驿天诺科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The technical problem solved by the present invention: provide an optical power monitoring unit and an optical power monitoring device for ultra-high temperature aging testing, and solve the problems that photodiodes do not support ultra-high temperature aging monitoring and have a short service life

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  • Optical power monitoring unit and optical power monitoring device for ultrahigh-temperature aging test
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  • Optical power monitoring unit and optical power monitoring device for ultrahigh-temperature aging test

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Embodiment Construction

[0023] The present invention will be further described below in conjunction with specific embodiments and accompanying drawings.

[0024] Embodiment 1 of the present invention discloses a specific structure of an optical power monitoring unit for an ultra-high temperature aging test, such as figure 1 As shown, it includes a photodiode 1 , a semiconductor light emitting chip 3 , a collimator lens 4 , and a heater metal block 5 . Wherein, the photodiode 1 is a semiconductor device composed of a PN junction, which has unidirectional conductivity and can convert optical signals into electrical signals. A photoelectric sensor can also be used, so the optical power of the semiconductor light-emitting chip 3 can be measured. The heater metal block 5 uses a heating device to heat the metal block according to different requirements, so as to meet the temperature required for the aging of the semiconductor light-emitting chip. The semiconductor light-emitting chip 3, such as a laser di...

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PUM

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Abstract

The invention provides an optical power monitoring unit and an optical power monitoring device for an ultrahigh-temperature aging test. The optical power monitoring unit comprises a heating metal block, a semiconductor light-emitting chip, a collimator and a photoelectric sensor; the semiconductor light-emitting chip is placed above the heating metal block and can emit divergent light when poweredon; the collimator is arranged in a transmission path of the divergent light and converts the divergent light into a collimated or nearly collimated light beam, and the photoelectric sensor receivesthe collimated light beam passing through a certain stroke and detects the optical power of the monitored semiconductor light-emitting chip. One or more reflectors can be arranged in the transmissionpath of the collimated light beam to change the transmission path of the light. By adopting the collimator, the divergent light is changed into a collimated or nearly-collimated light beam, so that the laser reaches a photodiode after passing through a certain stroke, the heat radiation of the heating metal block to the photodiode is weakened, so the photodiode supports ultra-high temperature aging monitoring, and the service life of the photodiode is effectively prolonged.

Description

technical field [0001] The invention relates to the field of aging testing, in particular to an optical power monitoring unit and an optical power monitoring device for ultra-high temperature aging testing. Background technique [0002] All semiconductor components need a certain degree of aging to screen out bad chips, so as to screen and eliminate components that fail or change in value, so as to ensure that the products that leave the factory can stand the test of time. The aging test of laser or LED equipment usually needs to monitor the optical power. In order to know the yield rate of the chip, it usually needs to monitor the wavelength performance. The monitoring of spectral performance has added value for failure analysis. Most of the burn-in equipment available on the market today provides voltage / current sourcing and measurement capabilities, and some of them provide optical power voltage / current testing capabilities (LIV or sometimes referred to as PIV). [0003]...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01J1/42
CPCG01J1/42G01R31/2635G01R31/2642
Inventor 王辉文单娜严黎明
Owner 武汉驿天诺科技有限公司
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