A sample stage for X-ray diffractometer, its application and X-ray diffractometer
A sample stage and diffractometer technology, applied in the field of X-ray diffractometer, can solve problems such as difficult quantitative analysis, inaccurate measurement data, complex preparation process, etc., and achieve the effects of accurate and reliable test data, low measurement background and convenient use
Active Publication Date: 2022-04-08
UNIVERSITY OF MACAU
View PDF0 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] The standard sample stage used by most X-ray diffractometers is a rectangular parallelepiped made of quartz glass. On one side of the rectangular parallelepiped, there is a rectangular sample groove perpendicular to the rectangular parallelepiped, with a depth of about 0.5mm. For general powder XRD testing It is generally applicable, but its disadvantage is that it is not suitable for measuring materials with a small amount of powder or thin film material samples. The glass substrate will produce obvious interference peaks (in the range of 20-40 degrees) and strong background ( Figure 5 Shown: the top measurement line), resulting in inaccurate measurement data and difficult quantitative analysis
At present, there is a sample stage for X-ray diffractometer made of single crystal silicon on the market, which has a very low background and produces few background peaks, but the preparation process is very complicated and expensive (about 2,000 RMB each)
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment
[0036] see figure 2 and Figure 4 , the application provides a sample stage 100 for an X-ray diffractometer, which includes a sample stage frame 110 and an amorphous structure film 120. In this embodiment, the sample stage frame 110 is connected to the bottom surface of the amorphous structure film 120 to support the amorphous structure. The structured membrane 120 is shaped.
[0037] see figure 1 , the sample stage skeleton 110 in this application is formed by bending the flexible support rod 111 , it should be understood that in other embodiments of the present invention, the sample stage skeleton 110 can also be spliced by using other rod-shaped structures.
[0038]Specifically, in this embodiment, the support rod 111 is formed by bending according to the size of the standard sample stage that is equipped with the X-ray diffractometer when it leaves the factory. Generally speaking, the standard sample stage is a cuboid structure, and a rectangular sample groove is ar...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
| Property | Measurement | Unit |
|---|---|---|
| thickness | aaaaa | aaaaa |
| diameter | aaaaa | aaaaa |
Login to View More
Abstract
The invention discloses a sample stage for an X-ray diffractometer, its application and an X-ray diffractometer, and relates to the field of X-ray diffractometers. The X-ray diffractometer uses a sample stage, which includes a sample stage skeleton and an amorphous structure film, the top of the sample stage skeleton is connected to the bottom surface of the amorphous structure film to support the amorphous structure film, and one side of the sample stage skeleton is used for inserting in an X-ray diffractometer. The sample stage for X-ray diffractometer provided by this application is easy to use, cheap, does not affect the original experimental mode, and has a low measurement background, making it possible to measure only a small amount of material samples and the test data is accurate and reliable. In addition, the present application also provides the application of the above-mentioned sample stage for X-ray diffractometer in the X-ray diffractometer for testing samples of thin film materials and materials with a small amount of powder. The X-ray diffractometer includes the above-mentioned sample stage for the X-ray diffractometer.
Description
technical field [0001] The invention relates to the field of X-ray diffractometers, in particular to a sample stage for an X-ray diffractometer, its application and an X-ray diffractometer. Background technique [0002] The English name of X-ray diffractometer is X-ray Powder diffractometer, abbreviated as XPD or XRD. X-ray diffractometer uses the principle of diffraction to accurately measure the crystal structure, texture and stress of substances, and accurately perform phase analysis, qualitative analysis, and quantitative analysis. Widely used in metallurgy, petroleum, chemical industry, scientific research, aerospace, teaching, material production and other fields. [0003] The standard sample stage used by most X-ray diffractometers is a rectangular parallelepiped made of quartz glass. On one side of the rectangular parallelepiped, there is a rectangular sample groove perpendicular to the rectangular parallelepiped, with a depth of about 0.5mm. For general powder XRD ...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20025
CPCG01N23/20025
Inventor 李海峰吴思朱英浩
Owner UNIVERSITY OF MACAU