Electromagnetic disturbance test system

Abstract

The invention provides an electromagnetic disturbance test system, which is used for carrying out electromagnetic interference test on a tested device. The system comprises a coupling and decoupling network and a power supply device, wherein the coupling and decoupling network comprises a coupling circuit and a decoupling circuit, the coupling circuit is connected between the tested device and thedecoupling circuit to input an interference signal, and the power supply device is connected with the coupling circuit in parallel to provide a test voltage to the tested device. According to the electromagnetic disturbance test system provided by the invention, the power supply voltage and the coupling unit are connected to the tested device in parallel in the electromagnetic compatibility testof the power device, the overvoltage phenomenon caused by resonance is avoided, the smooth electromagnetic compatibility test is ensured, and the user experience is improved.

Description

technical field [0001] The invention relates to the technical field of electromagnetic compatibility, in particular to an electromagnetic disturbance test system. Background technique [0002] In the electromagnetic compatibility test, the current conventional test method is to connect the supply voltage to the coupling and decoupling network in series, first decouple the supply voltage by the decoupling unit in the coupling and decoupling network, and then use the coupling unit in the coupling and decoupling network to decouple the supply voltage. The power supply voltage is coupled into the interference signal, and finally connected to the device under test for testing. [0003] In the test of power devices, it was found that when the upper machine station controls the equipment under test to start running, the equipment under test often reports an overvoltage fault in about 2-5 seconds, causing the test to be abnormally interrupted and unable to proceed. [0004] After r...

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Problems solved by technology

[0003] In the test of power devices, it was found that when the upper machine station controls the device under test to start running, the device under test often reports an overvoltage fault in about 2-5 seconds, causing the test to be interrupted abnormally and unable to proceed.

[0004] After research and conclusion, it is found that this phenomenon mostly occurs on power devices with switching power supplies, IGBTs and MOSs, and such samples generally add large capacitors and inductors to the ports for filtering, and because of space constraints, the gap between the capacitor and the load The wiring harness between them is longer, resulting in longer lead inductance. Under the impact of large current, the series and parallel connection of capacitor inductance and the decoupling unit in the coupling decoupling network will cause the amplitude of oscillation and ripple voltage to increase, which exceeds the detection voltage of the sample. Threshold, resulting in resonance caused by overvoltage phenomenon

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