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Full-automatic testing device for high-frequency electrical parameter characteristics of integrated circuit

A fully automatic test and parameter characteristic technology, which is applied in the direction of measuring devices, single semiconductor device testing, measuring electricity, etc., can solve problems such as ESR increase, and achieve the effect of reducing maintenance costs

Active Publication Date: 2020-04-17
福建福顺半导体制造有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Small changes in processing often result in significant increases in ESR

Method used

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  • Full-automatic testing device for high-frequency electrical parameter characteristics of integrated circuit

Examples

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Effect test

Embodiment 1

[0016] Example 1: See figure 1 , a fully automatic test device for high-frequency electrical parameter characteristics of integrated circuits, including a tester and a test board, the test board is connected to the tester, and the test board includes a CD4069 inverter, transistor Q1, transistor Q2 and CD4541 Counter, the pin 1 of the CD4069 inverter is connected to the resistor R1, the other end of the resistor R1 is connected to the capacitor C1 and the resistor R2, and the other end of the resistor R2 is connected to the pin 2 of the CD4069 inverter and the pin 3 of the CD4069 inverter, The other end of capacitor 1 is connected to pin 4 of the CD4069 inverter and pin 5 of the CD4069 inverter. Pin 6 of the CD4069 inverter is connected to the base of the transistor Q1 and the base of the transistor Q2. The CD4069 inverter Pin 14 is connected to the power supply VCC, pins 8-13 of the CD4069 inverter are all grounded, the collector of the transistor Q1 is connected to the collec...

Embodiment 2

[0018] Embodiment 2: On the basis of Embodiment 1, the test machine: DTS-1000 mass production test machine, which is an existing system, mainly includes two modules.

[0019] Host: Test the electrical parameters of the IC through the program. The test program is the software used in the test written according to the needs of different integrated circuit chips. It can detect the electrical parameters of the chip under test one by one, and can record it as a special data file in real time. After the test is completed, it can be converted into an XLS file.

[0020] Interface communication card: It mainly has two functions. First: since the test program is regarded as the software required to complete the test, the test host and test board are the hardware required to complete the test. How the hardware obeys the command of the software depends on both Collaborate with each other to achieve the purpose of quickly and accurately testing and sorting chips, which is to transmit signa...

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Abstract

The invention discloses a full-automatic testing device for high-frequency electrical parameter characteristics of an integrated circuit. The full-automatic testing device comprises a test machine anda test board card. The test board card is connected with the test machine; the test board card comprises a CD4069 phase inverter, a triode Q1, a triode Q2 and a CD4541 counter. A pin 1 of the CD4069phase inverter is connected with a resistor R1; the other end of the resistor R1 is connected with a capacitor C1 and a resistor R2; the other end of the resistor R2 is connected with a pin 2 of the CD4069 phase inverter and a pin 3 of the CD4069 phase inverter; the other end of the capacitor 1 is connected with a pin 4 of the CD4069 phase inverter and a pin 5 of the CD4069 phase inverter; the high-frequency working characteristics of MOSFET are tested at the lowest cost, the high-frequency working characteristics of the MOSFET are combined with a DTS-1000 testing machine, the high-frequency working characteristics of the MOSFET can be used for mass production and high-efficiency testing, and meanwhile the maintenance cost is greatly reduced.

Description

technical field [0001] The invention relates to the technical field of circuit testing, in particular to a fully automatic testing device for high-frequency electrical parameter characteristics of integrated circuits. Background technique [0002] The high-speed switching characteristics of MOSFETs are very sensitive to stray components (capacitance, inductance, and resistor impedance) on the test circuit. The result is that devices with the same switching data get inexplicably different switching times. ESR is affected by the gate process, such as polysilicon doping concentration, metal plating, contact resistance, etc., all of which affect high-speed switching performance. Small changes in processing often result in significant increases in ESR. Therefore, the measurement of ESR provides a test technology for measuring the consistency of high-speed switching for the industry. [0003] The invention is mainly used to test the switching characteristics of MOSFET under hig...

Claims

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Application Information

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IPC IPC(8): G01R31/26
CPCG01R31/2621
Inventor 游诗勇
Owner 福建福顺半导体制造有限公司
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