Memory device, memory and manufacturing method thereof, electronic device and chip
A technology for storage devices and manufacturing methods, which is applied in the field of memory, can solve problems such as the inability to fundamentally improve the storage capacity of DRAM, and achieve the effects of improving storage performance, small leakage current, and small threshold voltage
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[0051] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention.
[0052] Various schematic views of embodiments of the invention are shown in the drawings, which are not drawn to scale. Therein, certain details have been exaggerated and certain details may have been omitted for the sake of clarity. The shapes of the various regions and layers shown in the figure and their relative sizes and positional relationships are only exemplary, and in practice there may be deviations due to manufacturing tolerances or technical limitations, and those skilled in the art will According to actual needs, additional regions / layers with different shapes, sizes and relative positions can be designed.
[0053] Hereinafter, the terms "first", "secon...
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