Multi-thread multi-temperature-zone intelligent aging test machine

Abstract

The invention discloses a multi-thread multi-temperature-zone intelligent aging test machine. A plurality of pieces of ring test equipment, detection instruments and auxiliary software or functional modules are combined in one piece of equipment, multi-program and multi-instruction synchronous operation is realized through intelligent control of the system, and the stability condition of a productused in different environments can be timely and visually simulated through the auxiliary software. The investment cost can be reduced, and the investment amount of personnel, places, equipment and funds is reduced; the manual error rate is reduced, the manpower is reduced, the multi-device parameter debugging is reduced, and the personnel error rate is also reduced; the profit is maximized, theresearch and development period can be shortened, and the product can be put into the market as soon as possible to obtain greater profit; and the test machine is wide in application range and applicable to small and medium-sized enterprises.

Description

technical field [0001] The invention relates to the technical field of aging testing machines, in particular to an intelligent aging testing machine with multiple threads and multiple temperature zones. Background technique [0002] Semiconductor memory (semi-conductor memory) is a memory that uses semiconductor circuits as storage media. The internal memory is composed of semiconductor integrated circuits called memory chips. According to its function, it can be divided into: random access memory (RAM for short) and read-only memory (read-only ROM). Small size, fast storage speed, high storage density, and easy interface with logic circuits. [0003] For current semiconductor storage products, when testing in a simulated temperature-controlled environment, it is necessary to build a variety of testing equipment, such as constant temperature and humidity machines, pressure testing machines, power supplies, oscilloscopes, and defect detection auxiliary software. For a lon...

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Problems solved by technology

[0003] For current semiconductor storage products, when testing in a simulated temperature-controlled environment, it is necessary to build a variety of testing equipment, such as constant temperature and humidity machines, pressure testing machines, power supplies, oscilloscopes, and defect detection auxiliary software. For a long time, more manpower to do the test and get the test data results will also cause the following impacts: high R&D cost, multi-manpower, multi-equipment operation, and multi-site investment will increase the R&D cost; the R&D cycle is too long, which may also cause Lose the best opportunity to occupy the market and reduce the profit after the product is put into the market; when multiple personnel and multiple devices are used, when switching between different products, the parameter setting error may be caused by habitual operation, resulting in the risk of distortion of the detection data; such as product testing It is not suitable for small-scale enterprise applications due to the complexity, capital, site, equipment, personnel, etc.

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